MBM29F040C datasheet(23/41 Pages) SPANSION

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MBM29F040C-55/-70/-90

s AC CHARACTERISTICS

•

Read Only Operations Characteristics

Note: 1. Test Conditions:

Output Load: 1 TTL gate and 30 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.0 V to3.0 V

Timing measurement reference level

Input: 1.5 V

Output: 1.5 V

Parameter

Symbols

Description

Test Setup

-55

(Note1)

-70

(Note2)

-90

(Note2)

Unit

JEDEC

Standard

tAVAV

tRC

Read Cycle Time

—

Min.

tAVQV

tACC

Address to Output Delay

CE = VIL

OE = VIL

Max.

tELQV

tCE

Chip Enable to Output Delay

OE = VIL

Max.

tGLQV

tOE

Output Enable to Output Delay

—

Max.

tEHQZ

tDF

Chip Enable to Output HIGH-Z

—

Max.

tGHQZ

tDF

Output Enable to Output HIGH-Z

—

Max.

tAXQX

tOH

Output Hold Time From

Addresses,

CE or OE, Whichever Occurs First

—Min.

Figure 4

Test Conditions

5.0 V

Diodes = IN3064

or Equivalent

2.7 k

Ω

Device

Under

Test

IN3064

or Equivalent

6.2 k

Ω

Note: 1.CL = 30 pF including jig capacitance

2.CL = 100 pF including jig capacitance

Note: 2. Test Conditions:

Oput Load: 1 TTL gate and 100 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.45 V to 2.4 V

Timing measurement reference level

Input: 0.8 and 2.0 V

Output: 0.8 and 2.0 V

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