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STM32U073RCT6 Datasheet(PDF) 41 Page - STMicroelectronics

Part # STM32U073RCT6
Description  Ultra-low-power Arm® Cortex®-M0 32-bit MCU, up to 256-Kbyte flash memory, 40-Kbyte SRAM, USB, LCD
PDF  146 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32U073RCT6 Datasheet(HTML) 41 Page - STMicroelectronics

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6
Electrical characteristics
6.1
Parameter conditions
Unless otherwise specified, all voltages are referenced to VSS.
6.1.1
Minimum and maximum values
Unless otherwise specified the minimum and maximum values are guaranteed in the worst conditions of junction
temperature, supply voltage and frequencies by tests in production on 100 % of the devices with an junction
temperature at TJ = 25 °C and TJ = TJmax (given by the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics are indicated in the
table footnotes. Based on characterization, the minimum and maximum values refer to sample tests and
represent the mean value plus or minus three times the standard deviation (mean ± 3σ).
6.1.2
Typical values
Unless otherwise specified, typical data are based on TJ = 25 °C, VDD =VDDA = 3 V. They are given only as
design guidelines and are not tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from a standard diffusion
lot over the full temperature range, where 95% of the devices have an error less than or equal to the value
indicated (mean ± 2σ).
6.1.3
Typical curves
Unless otherwise specified, all typical curves are given only as design guidelines and are not tested.
6.1.4
Loading capacitor
The loading conditions used for pin parameter measurement are shown in Figure 11.
6.1.5
Pin input voltage
The input voltage measurement on a pin of the device is described in Figure 12.
Figure 11. Pin loading conditions
Device pin
C = 50 pF
Figure 12. Pin input voltage
Device pin
VIN
STM32U073x8/B/C
Electrical characteristics
DS14548 - Rev 2
page 41/146



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