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CC430F6137IRGCT.B Datasheet(PDF) 32 Page - Texas Instruments |
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CC430F6137IRGCT.B Datasheet(HTML) 32 Page - Texas Instruments |
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32 / 133 page ![]() 32 CC430F6137, CC430F6135, CC430F6127, CC430F6126, CC430F6125 CC430F5137, CC430F5135, CC430F5133 SLAS554I – MAY 2009 – REVISED SEPTEMBER 2018 www.ti.com Submit Documentation Feedback Specifications Copyright © 2009–2018, Texas Instruments Incorporated 5.27 USCI (UART Mode) Clock Frequency PARAMETER TEST CONDITIONS MIN MAX UNIT fUSCI USCI input clock frequency Internal: SMCLK or ACLK, External: UCLK, Duty cycle = 50% ±10% fSYSTEM MHz fBITCLK BITCLK clock frequency (equals baud rate in MBaud) 1 MHz (1) Pulses on the UART receive input (UCxRX) shorter than the UART receive deglitch time are suppressed. To ensure that pulses are correctly recognized, their duration should exceed the maximum specification of the deglitch time. 5.28 USCI (UART Mode) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VCC MIN MAX UNIT tτ UART receive deglitch time(1) 2.2 V 50 600 ns 3 V 50 600 5.29 USCI (SPI Master Mode) Clock Frequency PARAMETER TEST CONDITIONS MIN MAX UNIT fUSCI USCI input clock frequency Internal: SMCLK or ACLK, Duty cycle = 50% ±10% fSYSTEM MHz (1) fUCxCLK = 1/2tLO/HI with tLO/HI ≥ max(tVALID,MO(USCI) + tSU,SI(Slave), tSU,MI(USCI) + tVALID,SO(Slave)) For the slave parameters tSU,SI(Slave) and tVALID,SO(Slave), see the SPI parameters of the attached slave. (2) Specifies the time to drive the next valid data to the SIMO output after the output changing UCLK clock edge. See the timing diagrams in Figure 5-14 and Figure 5-15. (3) Specifies how long data on the SIMO output is valid after the output changing UCLK clock edge. Negative values indicate that the data on the SIMO output can become invalid before the output changing clock edge observed on UCLK. See the timing diagrams in Figure 5- 14 and Figure 5-15. 5.30 USCI (SPI Master Mode) over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (1) (see Figure 5-14 and Figure 5-15) PARAMETER TEST CONDITIONS PMMCOREVx VCC MIN MAX UNIT tSU,MI SOMI input data setup time 0 1.8 V 55 ns 3 V 38 3 2.4 V 30 3 V 25 tHD,MI SOMI input data hold time 0 1.8 V 0 ns 3 V 0 3 2.4 V 0 3 V 0 tVALID,MO SIMO output data valid time(2) UCLK edge to SIMO valid, CL = 20 pF 0 1.8 V 20 ns 3 V 18 3 2.4 V 16 3 V 15 tHD,MO SIMO output data hold time(3) CL = 20 pF 0 1.8 V –10 ns 3 V –8 3 2.4 V –10 3 V –8 |
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