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ISO7740FDWR Datasheet(PDF) 26 Page - Texas Instruments |
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ISO7740FDWR Datasheet(HTML) 26 Page - Texas Instruments |
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26 / 52 page  VI VCC IN OUT VO CL See Note A IN = 0 V (Devices without suffix F) IN = VCC (Devices with suffix F) VO VI VOL VOH VCC 0 V 1.7 V 50% tDO default high default low See Note B A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. B. Power Supply Ramp Rate = 10 mV/ns Figure 6-3. Default Output Delay Time Test Circuit and Voltage Waveforms IN OUT VCCO GNDI + ± VCM + ± VOH or VOL VCCI Pass-fail criteria: The output must remain stable. C = 0.1 µF ±1% C = 0.1 µF ±1% CL See Note A S1 GNDO A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 6-4. Common-Mode Transient Immunity Test Circuit ISO7740, ISO7741, ISO7742 SLLSEP4J – MARCH 2016 – REVISED OCTOBER 2024 www.ti.com 26 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated Product Folder Links: ISO7740 ISO7741 ISO7742 |
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