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CS5543 Datasheet(PDF) 17 Page - Cirrus Logic |
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CS5543 Datasheet(HTML) 17 Page - Cirrus Logic |
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17 / 30 page ![]() CS5542 CS5543 DS109PP2 17 written with two read cycles using different com- mands to read either the MSW (Most Significant Word) or the LSW (Least Significant Word). When reading or writing to the calibration regis- ters, the register contents are time-division multi- plexed into or out of the CS5543 in the same manner as conversion data as shown in Figure 5. In addition to writing or reading the calibration reg- isters, the CS5543 provides several test modes. Some of these test modes are as follows: The DATAOUT [3:0] pins can be set to a high imped- ance output state; or either of two different test pat- terns can be requested to be output on the DATAOUT [3:0] pins of the CS5543. See Table 4 for the test pattern information. Commands to change calibration modes or control modes should not be issued to the system while a calibration is in progress. New data for the calibra- tion or control modes is latched on every falling edge of CLKIN and takes effect on the following rising edge of FRAME. Test Pattern #1: (all channels) Table 4. Test Patterns Parity MSB SIGN LSB SIGN Parity MSB channel 0 channel 4 Parity MSB SIGN SIGN Parity MSB channel 2 channel 6 Parity MSB SIGN SIGN Parity MSB channel 1 channel 5 Parity MSB SIGN SIGN Parity MSB channel 3 channel 7 DATAOUT [0] DATAOUT [1] DATAOUT [2] DATAOUT [3] OD OD OD OD LSB LSB LSB LSB LSB LSB LSB OD OD OD OD Figure 5. Data Transfer Timing HEX BINARY Test Pattern #1: (All channels) A00001 0001 0000 0000 0000 0000 0001 Sign, MSB LSB, parity Test Pattern #2: (Unique for each channel) Channel HEX BINARY 0 1 2 3 4 5 6 7 1000A0 000A01 20A000 0A0001 450000 005001 800500 000051 0001 0000 0000 0000 0000 0001 0000 0000 0000 1010 0000 0001 0010 0000 1010 0000 0000 0000 0000 1010 0000 0000 0000 0001 0100 0101 0000 0000 0000 0000 0000 0000 0101 0000 0000 0001 1000 0000 0000 0101 0000 0000 0000 0000 0000 0000 0101 0001 Sign, MSB LSB, parity |
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