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LH28F008SC Datasheet(PDF) 25 Page - Sharp Corporation

Part # LH28F008SC
Description  8M (1M 횞 8) Flash Memory
PDF  38 Pages
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Manufacturer  SHARP [Sharp Corporation]
Direct Link  http://sharp-world.com/
Logo SHARP - Sharp Corporation

LH28F008SC Datasheet(HTML) 25 Page - Sharp Corporation

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8M (1M × 8) Flash Memory
LH28F008SC
25
AC CHARACTERISTICS - Read Only Operations1
VCC = 3.3 V ± 0.3 V, TA = 0°C to +70°C
SYMBOL
PARAMETER
LH28F008SC-120
LH28F008SC-150
UNIT
NOTE
MIN.
MAX.
MIN.
MAX.
t
AVAV
Read Cycle Time
120
150
ns
t
AVQV
Address to Output Delay
120
150
ns
t
ELQV
CE
» to Output Delay
120
150
ns
2
t
PHQV
RP
» High to Output Delay
600
600
ns
t
GLQV
OE
» to Output Delay
50
55
ns
2
t
ELQX
CE
» to Output in Low Z
0
0
ns
3
t
EHQZ
CE
» High to Output in High Z
55
55
ns
3
t
GLQX
CE
» to Output in Low Z
0
0
ns
3
t
GHQZ
OE
» High to Output in High Z
20
25
ns
3
t
OH
Output Hold from Addresses, CE
»
or OE
» change, whichever is first
00
ns
3
VCC = 5 V ± 0.5 V, 5 V ± 0.25 V, TA = 0°C to +70°C
SYMBOL
PARAMETER
LH28F00SC-855
V
CC ± 5%
LH28F00SC-906
V
CC ± 10%
LH28F00SA-1206
V
CC ± 10%
UNIT
NOTE
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
t
AVAV
Read Cycle Time
85
90
120
ns
t
AVQV
Address to Output Delay
85
90
120
ns
t
ELQV
CE
» to Output Delay
85
90
120
ns
2
t
PHQV
RP
» High to Output Delay
400
400
400
ns
t
GLQV
OE
» to Output Delay
40
45
50
ns
2
t
ELQX
CE
» to Output in Low Z
0
0
0
ns
3
t
EHQZ
CE
» High to Output in High Z
55
55
55
ns
3
t
GLQX
CE
» to Output in Low Z
00
0ns
3
t
GHQZ
OE
» High to Output in High Z
10
10
15
ns
3
t
OH
Output Hold from Addresses, CE
»
or OE
» change, whichever is first
00
0ns
3
NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE
  » may be delayed to to tELQV - tGLQV after the falling edge of CE  » without inpact on tELQV.
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed Configuration) for testing
characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration) for testing
characteristics.



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