MA1916

10/11

Figure 10: Flatpack Pinout

1T2

2T1

3 CE_CLKS

4 CE_IN

5 CE_OUT

6 TEST_POINT

7 N/C

8 ST1

9 GND

10 SEL_A

11 STZ

12 SEL_B

13 SZY

14 n_RST

28

MSG_OUT

27

CLK_OUT

26

SMC

25

RSE_OUT

24

SYZ

23

T3

22

CLKS

21

VDD

20

N/C

19

T0

18

MSG

17

CLK

16

READY

15

SMC_OUT

Bottom

View

RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

Dynex Semiconductor can provide radiation testing

compliant with Mil-Std-883 test method 1019, Ionizing

Radiation (Total Dose).

Total Dose (Function to specification)*

1x10

Transient Upset (Stored data loss)

5x10

Transient Upset (Survivability)

>1x10

Neutron Hardness (Function to specification)

>1x10

Single Event Upset**

<1x10

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Table 9: Radiation Hardness Parameters