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TMS28F008AST Datasheet(PDF) 34 Page - Texas Instruments |
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TMS28F008AST Datasheet(HTML) 34 Page - Texas Instruments |
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34 / 52 page ![]() TMS28F008Axy,TMS28F800Axy 1048576 BY 8BIT/524288 BY 16BIT AUTOSELECT BOOT BLOCK FLASH MEMORIES SMJS851A − NOVEMBER 1997 − REVISED FEBRUARY 1998 34 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 power-up and reset switching characteristics for TMS28F008AVy or ’ALy and TMS28F800AVy or ’ALy over recommended ranges of supply voltage (commercial and extended temperature ranges) (see Notes 10, 11, and 12) PARAMETER ALT. SYMBOL ’28F008AVy100 ’28F800AVy 100 ’28F008ALy100 ’28F800ALy100 ’28F008AVy120 ’28F800AVy 120 ’28F008ALy120 ’28F800ALy120 UNIT PARAMETER ALT. SYMBOL 3.3-V VCC RANGE 3.3-V VCC RANGE UNIT MIN MAX MIN MAX tsu(VCC) Setup time, RP low to VCC at 3 V MIN or 3.6 V MAX (see Note 13) tPL5V tPL3V 0 0 ns ta(DV) Access time, address valid to data valid tAVQV 100 120 ns tsu(DV) Setup time, RP high before data valid tPHQV 800 800 ns th(RP3) Hold time, VCC at 3 V (MIN) to RP high t3VPH 2 2 µs NOTES: 10. Characterization data available 11. All ac current values are RMS unless otherwise noted. 12. E and G are switched low after power up. 13. The power supply can switch low concurrently with RP going low. switching characteristics for TMS28F008AVy or ’ALy and TMS28F800AV or ’ALy over recommended ranges of supply voltage (commercial and extended temperature ranges) read operations PARAMETER ALT. SYMBOL ’28F008AVy 100 ’28F800AVy 100 ’28F008ALy100 ’28F800ALy100 ’28F008AVy 120 ’28F800AVy 120 ’28F008ALy120 ’28F800ALy120 UNIT PARAMETER SYMBOL 3 V 3 V UNIT MIN MAX MIN MAX ta(A) Access time, from A0 − A18 (see Note 14) tAVQV 100 120 ns ta(E) Access time, from CE tELQV 100 120 ns ta(G) Access time, from OE tGLQV 65 65 ns tc(R) Cycle time, read tAVAV 100 120 ns td(E) Delay time, CE low to low-impedance output tELQX 0 0 ns td(G) Delay time, OE low to low-impedance output tGLQX 0 0 ns tdis(E) Disable time, CE to high-impedance output tEHQZ 55 55 ns tdis(G) Disable time, OE to high-impedance output tGHQZ 45 45 ns th(D) Hold time, DQ valid from A0 − A17, CE, or OE, whichever occurs first (see Note 14) tAXQX 0 0 ns tsu(EB) Setup time, BYTE from CE low tELFL tELFH 7 5 ns td(RP) Delay time, output from RP high tPHQV 800 800 ns tdis(BL) Disable time, BYTE low to DQ8 − DQ15 in the high-impedance state tFLQZ 100 120 ns ta(BH) Access time, from BYTE going high tFHQV 100 120 ns NOTE 14: For 28F800 (8-bit configuration) A−1, A−1 −A18 with A−1 as LSB address. For 28F008 (16-bit configuration): A0−A19 with A0 as LSB address. |
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