DS3134 datasheet(51/203 Pages) DALLAS

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DS3134

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Bit 11 / Status Bit for Receive DMA Done Queue Write Error (RDQWE).

0 = interrupt masked

1 = interrupt unmasked

Bit 12 / Status Bit for Transmit FIFO Underflow (TUDFL).

0 = interrupt masked

1 = interrupt unmasked

Bit 13 / Status Bit for Transmit DMA Pending Queue Read (TPQR).

0 = interrupt masked

1 = interrupt unmasked

Bit 14 / Status Bit for Transmit DMA Done Queue Write (TDQW).

0 = interrupt masked

1 = interrupt unmasked

Bit 15 / Status Bit for Transmit DMA Done Queue Write Error (TDQWE).

0 = interrupt masked

1 = interrupt unmasked

4.4 TEST REGISTER DESCRIPTION

TEST

0050h

5432

n/a

Note: Bits that are underlined are read only, all other bits are read-write; default value for all bits is 0.

Bit 0 / Factory Test (FT).

This bit is used by the factory to place the DS3134 into the test mode. For normal device operation, this

bit should be set to zero whenever this register is written to. Setting this bit places the RAMs into a low

power standby mode.

Bit 1 to 15 / Device internal test bits. Bits 1 to 15 shown in the above table is for CHATEAU internal

(Dallas Semiconductor) tests use, not user test mode controls. Values of these bits should always be “0”.

If any of these bits are set to “1” device will not function properly.

DS3134 Datasheet(PDF) 51 Page - Dallas Semiconductor