DSOX6MASK datasheet(19/45 Pages) KEYSIGHT

19 / 45 page

19 | Keysight | InfiniiVision 6000 X-Series Oscilloscopes - Data Sheet

Integration (Continued)

Optional mask/limit testing

Whether you are performing pass/fail tests to specified standards

in manufacturing or testing for infrequent signal anomalies,

mask/limit testing (Option DSOX6MASK) can be a valuable

productivity tool. The 6000 X-Series features powerful hardware-

based mask testing and can perform up to 130,000 tests per

second. You can select multiple test criteria, including the ability

to run tests for a specific number of acquisitions, a specified time,

or until detection of a failure. You can set the 6000 X-Series to

beep when the mask fails.

Figure 41. Mask testing of serial data.

New Standard for Price Performance: Bandwidth, Visualization, and Integration

Figure 42. Searching for and navigating to a specific pulse width.

Find events faster with search and navigation

features

Parametric and serial bus search and navigation features come

standard on the 6000 X-Series oscilloscopes. When you are

capturing long, complex waveforms using an oscilloscope’s

acquisition memory, manually scrolling through stored waveform

data to find specific events of interest can be slow and

cumbersome. With automatic search, navigation, and listing,

you can easily set up specific search criteria and then quickly

navigate to “found and marked” events. Available search criteria

include edges, pulse width (time-qualified), rise/fall times (time-

qualified), runt pulses (time- and level-qualified), frequency peaks

(up to 11 peaks), and serial bus frames, packets, and errors. The

side-bar lister gives you an overview of the time tag of each found

event relative to the trigger location.

DSOX6MASK Datasheet(PDF) 19 Page - Keysight Technologies