EKTF6708 datasheet(157/158 Pages) EMC

157 / 158 page

eKTF6708

8-Bit Microcontroller

IC Product Specification (V1.2) 03.12.2020

 147

(This specification is subject to change without prior notice)

Quality Assurance and Reliability

Test Category

Test Conditions

Remarks

Solderability

Solder temperature=245

5°C, for 5 seconds up to the

stopper using a rosin-type flux

–

Pre-condition

Step 1: TCT, 65°C (15 min)~150°C (15 min), 10 cycles

For SMD IC (such as

SOP, QFP, SOJ, etc)

Step 2: Bake at 125°C, TD (endurance)=24 hrs

Step 3: Soak at 30°C/60%，TD (endurance)=192 hrs

Step 4: IR flow 3 cycles

(Pkg thickness

 2.5 mm or

Pkg volume

 350 mm3 ----225  5°C)

(Pkg thickness

 2.5 mm or

Pkg volume

 350 mm3 ----240  5°C)

Temperature cycle test

-65°C (15mins)~150°C (15 min), 200 cycles

–

Pressure cooker test

TA =121°C, RH=100%, pressure=2 atm,

TD (endurance)= 96 hrs

–

High temperature /

High humidity test

TA=85°C, RH=85%，TD (endurance) = 168, 500 hrs

–

High-temperature

storage life

TA=150°C, TD (endurance) = 500, 1000 hrs

–

High-temperature

operating life

TA=125°C, VCC = Max. operating voltage,

TD (endurance) = 168, 500, 1000 hrs

–

Latch-up

TA=25°C, VCC = Max. operating voltage, 150mA/20V

–

ESD (HBM)

TA=25°C,

∣ ± 8KV∣

–

D.1 Address Trap Detect

An address trap detect is one of the MCU embedded fail-safe functions that detects MCU

malfunction caused by noise or the like. Whenever the MCU attempts to fetch an instruction from a

certain section of ROM, an internal recovery circuit is auto started. If a noise-caused address error is

detected, the MCU will repeat execution of the program until the noise is eliminated. The MCU will

then continue to execute the next program.

EKTF6708 Datasheet(PDF) 157 Page - ELAN Microelectronics Corp

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