TESTS AND REQUIREMENTS

Essentially all tests are carried out in accordance with the schedule of

“IEC publication 115-8”, category LCT/UCT/56 (rated temperature range:

Lower Category Temperature, Upper Category Temperature; damp heat,

long term, 56 days). The testing also covers the requirements specified by

EIA and EIAJ.

The tests are carried out in accordance with IEC publication 68,

“Recommended basic climatic and mechanical robustness testing

procedure for electronic components” and under standard atmospheric

conditions according to

“IEC 68-1”, subclause 5.3.

Unless otherwise specified the following values apply:

Temperature: 15

°Cto35 °C

Relative humidity: 45% to 75%

Air pressure: 86 kPa to 106 kPa (860 mbar to 1060 mbar).

In Table 4 the tests and requirements are listed with reference to the

relevant clauses of

“IEC publications 115-8 and 68”; a short description of

the test procedure is also given. In some instances deviations from the

IEC recommendations were necessary for our method of specifying.

All soldering tests are performed with mildly activated flux.

Table 4

Test procedures and requirements

IEC

115-8

CLAUSE

IEC 68-2

TEST

METHOD

TEST

PROCEDURE

RESISTANCE

RANGE

REQUIREMENTS

RC01

RC11

RC21

RC31

Tests in accordance with the schedule of IEC publication 115-8

4.4.1

visual

examination

no holes; clean surface; no damage

4.4.2

dimensions

(outline;

see Fig.11)

gauge (mm)

0.45

≤ T ≤

0.65

0.45

≤ T ≤

0.65

0.35

≤ T ≤

0.55

0.30

≤ T ≤

0.40

1.45

≤ W ≤

1.75

1.10

≤ W ≤

1.40

0.75

≤ W ≤

0.95

0.45

≤ W ≤

0.55

3.0

≤ L ≤

3.3

1.85

≤ L ≤

2.15

1.50

≤ L ≤

1.70

0.95

≤ L ≤

1.05

4.5

resistance

applied voltage (+0/

−10%):

R

max.

±2% or

R

max.

±5%

R

max.

±5%

R<10

Ω: 0.1 V

10

Ω≤ R < 100 Ω: 0.3 V

100

Ω≤ R<1kΩ:1V

1k

Ω≤ R < 10 kΩ:3V

10 k

Ω≤ R < 100 kΩ:10V

100 k

Ω≤ R<1MΩ:25V

R

≥ 1MΩ:50V