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RC21 Datasheet(PDF) 10 Page - NXP Semiconductors

Part # RC21
Description  Standard chip resistors
PDF  11 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

RC21 Datasheet(HTML) 10 Page - NXP Semiconductors

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4.18
20 (Ta)
resistance to
soldering heat
unmounted chips; 10 s; 260
±5 °C
no visual
damage
∆R/R max.:
±0.5% +0.05 Ω;
no visual
damage
∆R/R max.:
±1% +0.1 Ω
4.29
45 (Xa)
component
solvent
resistance
isopropyl alcohol or H2O followed
by brushing in accordance with
“MIL 202 F”
no visual damage
4.17
20 (Ta)
solderability
unmounted chips completely
immersed for 2
±0.5 s in a solder
bath at 235
±5 °C
good tinning (
≥95% covered); no visual damage
4.7
voltage proof on
insulation
maximum voltage (RMS) during
1 minute metal block method
no breakdown or flashover
4.13
short time
overload
room temperature; P = 6.25
× P
n;
5 s (V
≤ 2 × Vmax)
∆R/R max.:
±1% +0.05 Ω
∆R/R max.:
±2% +0.1 Ω
4.33
bending
resistors mounted on a 90 mm
glass epoxy resin PCB (FR4),
bending: 3 mm for RC01 and
5 mm for RC11, RC21 and RC31
no visual damage
∆R/R max.: ±1% +0.05 Ω
4.19
14 (Na)
rapid change of
temperature
30 minutes at LCT and
30 minutes at UCT; 5 cycles
no visual
damage
∆R/R max.:
±0.5% +0.05 Ω
no visual
damage
∆R/R max.:
±2% +0.1 Ω
4.23
climatic
sequence:
4.23.3
30 (D)
damp heat
(accelerated)
1st cycle
4.23.6
30 (D)
damp heat
(accelerated)
remaining
cycles
6 days; 55
°C; 95 to 98% RH
Rins min.: 104 MΩ
R
≤ 1MΩ∆R/R max.:
±1.5% +0.1 Ω
∆R/R max.:
±1% +0.1 Ω
R>1M
Ω∆R/R max.: ±3% +0.1 Ω
not applicable
IEC
115-8
CLAUSE
IEC 68-2
TEST
METHOD
TEST
PROCEDURE
RESISTANCE
RANGE
REQUIREMENTS
RC01
RC11
RC21
RC31



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