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AAT3603 Datasheet(PDF) 7 Page - Advanced Analogic Technologies |
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AAT3603 Datasheet(HTML) 7 Page - Advanced Analogic Technologies |
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7 / 35 page  AAT3603178 Total Power Solution for Portable Applications PRODUCT DATASHEET 3603.2008.06.1.0 7 www .analogictech.com AAT3603178 Total Power Solution for Portable Applications PRODUCT DATASHEET 3603.2008.06.1.0 7 www .analogictech.com Electrical Characteristics1 VIN = 5V, VBAT = 3.6V, -40°C ≤ TA ≤ +85°C, unless noted otherwise. Typical values are TA = 25°C. Symbol Description Conditions Min Typ Max Units Logic Control / Protection (continued) VOCP Over Current Protection Threshold 105 %VCS TC Constant Current Mode Time Out CCT = 100nF, VCHGIN = 5V 3 Hours TK Trickle Charge Time Out TC/8 Hours TV Constant Voltage Mode Time Out 3 Hours ITS Current Source from TS Pin 71 75 79 μA TS1 TS Hot Temperature Fault Falling Threshold 318 331 346 mV Hysteresis 25 TS2 TS Cold Temperature Fault Rising Threshold 2.30 2.39 2.48 V Hysteresis 25 mV TLOOP_IN Thermal Loop Entering Threshold 115 °C TLOOP_OUT Thermal Loop Exiting Threshold 85 °C TREG Thermal Loop Regulation 100 °C Step-Down Buck Converter (Core) VOUTBUCK Output Voltage Accuracy IOUTBUCK = 0 ~ 300mA; VIN = 2.7V ~ 5.5V 1.71 1.80 1.89 V ILIMOUTBUCK P-Channel Current Limit 0.8 A RDS(ON)L High Side Switch On-Resistance 0.8 Ω RDS(ON)H Low Side Switch On-Resistance 0.8 Ω FOSC Oscillator Frequency TA = 25°C 1.5 MHz TS Start-Up Time From Enable to Regulation; COUTBUCK = 4.7μF, CNOISE = On 100 μs LDO1 (PowerDigital) VOUT1 Output Voltage Accuracy IOUT1 = 0~300mA -3 +3 % IOUT1 Output Current 300 mA ILIM1 Output Current Limit 1000 mA VDO1 Dropout Voltage IOUT1 = 300mA 160 320 mV ΔVOUT1(VOUT1ΔVIN1) Line Regulation IOUT1 = 100mA 0.07 %/V ΔVOUT1 Load Regulation IOUT1 = 0.5mA ~ 150mA 40 mV PSRR Power Supply Rejection Ratio IOUT1 = 10mA, COUT1=22μF, 100Hz ~ 10KHz 60 dB TS Start Up Time From Enable to Regulation; C OUT1 = 22μF, CNOISE = On 175 μs 1. Specification over the –40°C to +85°C operating temperature range is assured by design, characterization and correlation with statistical process controls. |
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