TLE4247

General Product Characteristics

Datasheet

6

Rev. 1.01, 2010-05-04

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

T

(unless otherwise specified)

1) Not subject to production test, specified by design.

Pos.

Parameter

Symbol

Limit Values

Unit

Conditions

Min.

Max.

Pin S (IC Supply)

4.1.1

Voltage at pin S

V

S

-0.3

45

V

V

I

4.1.2

Current into pin S

I

S

-400

–

mA

V

Pin IN (Relay Coil Current Input)

4.1.3

Voltage at pin IN

V

IN

-0.3

30

V

V

I

4.1.4

Current into pin IN

I

IN

-250

400

mA

–

Pin D (Delay)

4.1.5

Voltage at pin D

V

D

-0.3

6.8

V

Temperatures

4.1.6

Junction Temperature

T

j

-40

150

°C–

4.1.7

Storage Temperature

T

stg

-55

150

°C–

ESD Susceptibility

4.1.8

ESD Resistivity to CGND

V

ESD,HBM

-4

4

kV

2) ESD susceptibility, Human Body Model “HBM” according to EIA/JESD 22-A114B

4.1.9

ESD Resistivity middle pins

V

1.5

kV

3) ESD susceptibility, Charged Device Model “CDM” according to EIA/JESD22-C101 or ESDA STM5.3.1