AC CHARACTERISTICS

PARAMETER

SYMBOL

MIN.

MAX.

UNIT

Read cycle time

500

ns

Address access time

500

ns

Chip enable

access time

500

ns

500

ns

Output enable access time

200

ns

Output hold time

10

ns

Chip enable to

output in Low-Z

20

ns

20

ns

Output enable to output in Low-Z

10

ns

Chip enable to

output in High-Z

060

ns

060

ns

Output disable to output in High-Z

040

ns

PARAMETER

SYMBOL

MIN.

MAX.

UNIT

Write cycle time

500

ns

Chip enable to end of write

250

ns

Address valid to end of write

250

ns

Address setup time

100

ns

Write pulse width

150

ns

Write recovery time

50

ns

Data valid to end of write

100

ns

Data hold time

0ns

Output active from end of write

20

ns

WE to output in High-Z

060

ns

OE to output in High-Z

040

ns

NOTE:

1.

Active output to high-impedance and high-impedance to output

active tests specified for a

±200 mV transition

from steady state levels into the test load.

AC TEST CONDITIONS

PARAMETER

MODE

NOTE

Input voltage amplitude

Input rise/fall time

10 ns

Timing reference level

1.5 V

Output load conditions

1

NOTE:

1.

Includes scope and jig capacitance.

PARAMETER

SYMBOL

CONDITIONS

MIN.

TYP.

MAX.

UNIT

Input capacitance

7

pF

Input/output capacitance

10

pF

NOTE:

This parameter is sampled and not production tested.

LH5164ASH

CMOS 64K (8K

× 8) Static RAM

4