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MPXD2005VMM80R Datasheet(PDF) 93 Page - Freescale Semiconductor, Inc

Part # MPXD2005VMM80R
Description  PXS20 Microcontroller
PDF  119 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MPXD2005VMM80R Datasheet(HTML) 93 Page - Freescale Semiconductor, Inc

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Electrical characteristics
PXS20 Microcontroller Data Sheet, Rev. 1
Preliminary—Subject to Change Without Notice
Freescale Semiconductor
93
3.16
Flash memory electrical characteristics
4 During the sample time the input capacitance CS can be charged/discharged by the external source. The internal resistance
of the analog source must allow the capacitance to reach its final voltage level within tsample. After the end of the sample time
tsample, changes of the analog input voltage have no effect on the conversion result. Values for the sample clock tsample
depend on programming.
5 This parameter does not include the sample time t
sample, but only the time for determining the digital result and the time to
load the result register with the conversion result.
6 See Figure 9.
7 For the 144-pin package.
8 No missing codes.
Table 24. Flash memory program and erase electrical specifications
No.
Symbol
Parameter
Min
Typ1
1 Typical program and erase times assume nominal supply values and operation at T
J =25 °C. These values are
characterized, but not tested.
Factory
Avg2
2 Factory Average program and erase times represent the effective performance averaged over > 1024 pages or blocks,
and are provided for factory throughput estimation assuming < 100 program/erase cycles, nominal supply values and
operation at TJ =25 °C. These values are characterized, but not tested.
Initial
Max3
3 Initial Max program and erase times provide guidance for time-out limits used in the factory and apply for < 100
program/erase cycles, nominal supply values and operation at TJ =25 °C. These values are verified at production test.
Lifetime
Max4
4 Lifetime Max program and erase times apply across the voltage, temperature, and cycling range of product life. These
values are characterized, but not tested.
Unit
1TDWPROGRAM *
5
5 See Notes for individual specifications, as shown in column headings.
Double word (64 bits) program time6
6 Actual hardware programming times. These do not include software overhead.
—
39
—
—
500
µs
2TPPROGRAM *
5 Page(128 bits) program time6
—
48
53
100
500
µs
3T16KPPERASE *
5 16 KB block pre-program and erase time
—
TBD
TBD
500
5000
ms
4T48KPPERASE *
5 48 KB block pre-program and erase time
—
TBD
TBD
750
5000
ms
5T64KPPERASE *
5 64 KB block pre-program and erase time
—
TBD
TBD
900
5000
ms
6T128KPPERASE *
5 128 KB block pre-program and erase time
—
TBD
TBD
1300
7500
ms
7T256KPPERASE *
5 256 KB block pre-program and erase time
—
TBD
TBD
2600
15000
ms
Table 25. Flash memory timing
Symbol
Parameter
Value
Unit
Min
Typ
Max
TRES
D Time from clearing the MCR-ESUS or PSUS bit with EHV = 1
until DONE goes low
—
—
100
ns
TDONE
D Time from 0 to 1 transition on the MCR-EHV bit initiating a
program/erase until the MCR-DONE bit is cleared
——
5
ns



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