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ADM3311EARSZ Datasheet(PDF) 17 Page - Analog Devices |
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ADM3311EARSZ Datasheet(HTML) 17 Page - Analog Devices |
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17 / 24 page ![]() Data Sheet ADM3307E/ADM3310E/ADM3311E/ADM3312E/ADM3315E Rev. I | Page 17 of 24 R1 C1 ESD TEST METHOD R2 C1 IEC1000-4-2 1.5kV 100pF HUMAN BODY MODEL ESD ASSOC. STD 55.1 330V 150pF DEVICE UNDER TEST HIGH VOLTAGE GENERATOR R2 Figure 34. ESD Test Standards 100 90 36.8 10 TIME t tDL tRL Figure 35. Human Body Model ESD Current Waveform 100 90 10 TIME t 30ns 60ns 0.1ns TO 1ns Figure 36. IEC1000-4-2 ESD Current Waveform The ADM33xxE devices are tested using both of the previously mentioned test methods. All pins are tested with respect to all other pins as per the Human Body Model, ESD Assoc. Std. 55.1 specification. In addition, all I/O pins are tested as per the IEC 1000-4-2 test specification. The products were tested under the following conditions: Power-On—Normal Operation Power-Off There are four levels of compliance defined by IEC 1000-4-2. The ADM33xxE parts meet the most stringent compliance level for both contact and air-gap discharge. This means the products are able to withstand contact discharges in excess of 8 kV and airgap discharges in excess of 15 kV. Table 9. IEC 1000-4-2 Compliance Levels Level Contact Discharge (kV) Air Discharge (kV) 1 2 2 2 4 4 3 6 8 4 8 15 |
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