TAS5729MD datasheet(4/59 Pages) TI1

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TAS5729MD

SLOS836A – MAY 2013 – REVISED JUNE 2013

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TAS5729MD Pin Out (continued)

DVDD

Power supply for the internal digital circuitry

GVDD_REG

Voltage regulator derived from PVDD supply(3)

LRCLK

Pulldown

Word select clock of the serial audio port.

MCLK

Pulldown

Master clock used for internal clock tree and sub-circuit and state machine clocking

Not connected inside the device (all NC terminals should be connected to ground

for optimal thermal performance)

Ground for oscillator circuitry (this terminal should be connected to the system

OSC_GND

ground)

OSC_RES

Connection point for oscillator trim resistor

Quick powerdown of the device that is used upon an unexpected loss of PVDD or

DVDD power supply in order to quickly transition the outputs of the speaker

PDN

Pullup

amplifier to hi-Z. This quick powerdown feature avoids the audible anamolies that

would occur as a result of loss of either of the supplies.

PGND

1, 44

Ground for power device circuitry(2)

PLL_FLTM

AI/AO

Negative connection point for the PLL loop filter components

PLL_FLTP

AI/AO

Positive connection point for the PLL loop filter components

PLL_GND

Ground for PLL circuitry (this terminal should be connected to the system ground)

Thermal and ground pad that provides both an electrical connection to the ground

PowerPAD™

plane and a thermal path to the PCB for heat dissipation. This pad must be

grounded to the system ground. (4)

PVDD

4, 41

Power supply for internal power circuitry

RST

Pullup

Places the device in reset when pulled low

SCL

I²C serial control port clock

SCLK

Pulldown

Bit clock of the serial audio port

SDA

DI/DO

I²C serial control port data

SDIN

Pulldown

Data line to the serial data port

SPK_OUTx

2, 43, 45, 48

Speaker amplifier outputs

Controls ramp time of SPK_OUTx to minimize pop. Leave this pin floating for BD

SSTIMER

mode. Requires capacitor to GND in AD mode, as is shown in the Typical

Application Circuit Diagrams. The capacitor determines the ramp time.

TEST1

Used for testing during device production (this terminal must be left floating)

TEST2

Used for testing during device production (this terminal must be left floating)

TEST3

Used for testing during device production (this terminal must be connected to GND)

(4)

This terminal should be connected to the system ground

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