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TAS5729MD Datasheet(PDF) 6 Page - Texas Instruments |
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TAS5729MD Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 59 page  TAS5729MD SLOS836A – MAY 2013 – REVISED JUNE 2013 www.ti.com ELECTRICAL SPECIFICATIONS AND CHARACTERISTICS DIGITAL I/O PINS over operating free-air temperature range (unless otherwise noted) Parameter Test Conditions Min Typ Max Unit |IIH| Input Logic "High" Current Level All digital pins - - 75 µA VIH Input Logic "High" threshold for DVDD All digital pins 2 - - V Referenced Digital Inputs |IIL| Input Logic "Low" Current Level All digital pins - - 75 µA VIL Input Logic "Low" threshold for DVDD All digital pins - - 0.8 V Referenced Digital Inputs VOH Output Logic "High" Voltage Level IOH = 4 mA, VDD = 3V 2.4 - - V VOL Output Logic "Low" Voltage Level IOH = -4 mA, VDD = 3V - - 0.5 V MASTER CLOCK over operating free-air temperature range (unless otherwise noted) Parameter Test Conditions Min Typ Max Unit DMCLK Allowable MCLK Duty Cycle 40 50 60 % fMCLK Supported MCLK Frequencies 2.8224 - 24.576 MHz tr Rise and fall time for MCLK - - 5 ns tf SERIAL AUDIO PORT over operating free-air temperature range (unless otherwise noted) Parameter Test Conditions Min Typ Max Unit fSCLK Supported SCLK Frequencies Values include 32, 48, and 64 32 - 64 x fS DSCLK Allowable SCLK Duty Cycle 40 50 60 % Required SDIN Setup Time before SCLK tsu2 10 - - ns Rising Edge Required SDIN Hold Time after SCLK th2 10 - - ns Rising Edge fS Supported Input Sample Rates 8 - 48 kHz DLRCLK Allowable LRCLK Duty Cycle 40 50 60 % tsu1 Required LRCLK to SCLK Rising Edge 10 - - ns th1 Required LRCLK to SCLK Rising Edge 10 - - ns tr Rise and fall time for SCLK and LRCLK - - 8 ns tf Allowable LRCLK drift before LRCLK - - 4 MCLKs reset PROTECTION CIRCUITRY over operating free-air temperature range (unless otherwise noted) Parameter Test Conditions Min Typ Max Unit Overcurrent Threshold for each BTL OCETHRES PVDD = 15V, TA = 25°C - 4.5 - A Output UVETHRES(PVDD) Undervoltage Error (UVE) Threshold PVDD falling - 4 - V UVETHRES(AVDD) Undervoltage Error (UVE) Threshold AVDD falling - 4.1 - V UVEHYST(PVDD) UVE Recovery Threshold PVDD rising - 4.5 - V UVEHYST(AVDD) UVE Recovery Threshold AVDD rising - 2.7 - V Overtemperature Error (OTE) OTETHRES - 150 - °C Threshold OTEHYST OTE Recovery Threshold - 30 - °C 6 Copyright © 2013, Texas Instruments Incorporated Product Folder Links: TAS5729MD |
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