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AN3978 Datasheet(PDF) 12 Page - STMicroelectronics |
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AN3978 Datasheet(HTML) 12 Page - STMicroelectronics |
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12 / 19 page ![]() EMC testing AN3978 12/19 Doc ID 022179 Rev 1 4 EMC testing The EMC requirements according to IEC61131-2 have been verified. Application tests showed much better results than the requirements given by the industrial standard. The test results are listed in the tables below. No additional protection devices have been used in the application. According to Table 1 and Table 2, it is clear that the chosen optical isolators functionality is influenced by the burst noise. Therefore, performance criteria A is achieved with up to 3 kV burst amplitude, the system then behaves according to criteria B. A trial has been carried out and primary and secondary GNDs have been shorted in order to limit common mode transients across the optical isolation. In this configuration the performance criteria A is fulfilled also for higher burst amplitudes. Therefore, the application designer should choose different isolators if a higher level of immunity must be achieved. Selection should target isolators with a high CMR (“Common Mode Rejection”) parameter. Table 1. Application EFT (burst) robustness, applied to supply voltage lines Configuration EFT test signal amplitude, test results at polarity (+ / -) 1 kV 2 kV 3 kV 4 kV 5 kV Standard demonstration board configuration A / A A / A A / A B / B B / B Primary and secondary GNDs shorted A / A A / A A / A A / A A / A Table 2. Application EFT (burst) robustness, applied to output lines Configuration EFT test signal amplitude, test results at polarity (+ / -) 1 kV 2 kV 3 kV 4 kV 5 kV Standard demonstration board configuration A / A A / A A / A B / B B / B Primary and secondary GNDs shorted A / A A / A A / A A / A A / A Table 3. Application surge test results, surge applied to supply lines Configuration Mode Surge test signal amplitude, test results at polarity (+ / -) 1 kV 2 kV 3 kV 4 kV Standard demonstration board configuration Common (CM) A / A A / A A / A A / A Differential (DM) B / B B / B B / B B / B |
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