LMV844MTSLASHNOPB datasheet(3/38 Pages) TI

3 / 38 page

LMV841, LMV842, LMV844

www.ti.com

SNOSAT1G – OCTOBER 2006 – REVISED FEBRUARY 2013

Operating Ratings

(1)

Temperature Range (2)

−40°C to +125°C

Supply Voltage (V+ – V−)

2.7V to 12V

Package Thermal Resistance [

θJA

(2)]

5-Pin SC70

334 °C/W

8-Pin VSSOP

205 °C/W

8-Pin SOIC

126 °C/W

14-Pin TSSOP

110 °C/W

14-Pin SOIC

93 °C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

The maximum power dissipation is a function of TJ(MAX), θJA, and TA. The maximum allowable power dissipation at any ambient

temperature is PD = (TJ(MAX) - TA) / θJA . All numbers apply for packages soldered directly onto a PC board.

3.3V Electrical Characteristics

(1)

Unless otherwise specified, all limits are guaranteed for TA = 25°C, V

+ = 3.3V, V− = 0V, V

CM = V

+/2, and R

L > 10MΩ to V

+/2.

Boldface limits apply at the temperature extremes.

Min

Typ

Max

Symbol

Parameter

Conditions

Units

(2)

(3)

(2)

±50

±500

VOS

Input Offset Voltage

μV

±800

TCVOS

Input Offset Voltage Drift (4)

0.5

±5

μV/°C

Input Bias Current

0.3

(4) (5)

300

IOS

Input Offset Current

Common Mode Rejection Ratio LMV841

112

≤ VCM ≤ 3.3V

CMRR

Common Mode Rejection Ratio LMV842

106

≤ VCM ≤ 3.3V

and LMV844

108

PSRR

Power Supply Rejection Ratio

2.7V

≤ V+ ≤ 12V, VO = V

+/2

CMVR

Input Common-Mode Voltage Range

CMRR

≥ 50 dB

–0.1

3.4

RL = 2 kΩ

100

123

VO = 0.3V to 3.0V

AVOL

Large Signal Voltage Gain

RL = 10 kΩ

100

131

VO = 0.2V to 3.1V

RL = 2 kΩ to V

+/2

120

Output Swing High,

(measured from V+)

RL = 10 kΩ to V

+/2

100

RL = 2 kΩ to V

+/2

120

Output Swing Low,

(measured from V−)

RL = 10 kΩ to V

+/2

(1)

Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

(4)

This parameter is guaranteed by design and/or characterization and is not tested in production.

(5)

Positive current corresponds to current flowing into the device.

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