FDC2114RGHT datasheet(6/61 Pages) TI1

6 / 61 page

FDC2212, FDC2214, FDC2112, FDC2114

SNOSCZ5A – JUNE 2015 – REVISED JUNE 2015

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8.5 Electrical Characteristics

Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V

(1)

PARAMETER

TEST CONDITIONS(2)

MIN(3)

TYP(4)

MAX(3)

UNIT

POWER

VDD

Supply voltage

TA = –40°C to +125°C

2.7

3.6

IDD

Supply durrent (not including

CLKIN = 10MHz(6)

2.1

sensor current)(5)

IDDSL

Sleep mode supply current(5)

µA

ISD

Shutdown mode supply current(5)

0.2

µA

CAPACITIVE SENSOR

CSENSORMAX

Maximum sensor capacitance

1mH inductor, 10kHz oscillation

250

CIN

Sensor pin parasitic capacitance

NBITS

Number of bits

FDC2112, FDC2114

bits

RCOUNT

≥ 0x0400

FDC2212, FDC2214

bits

RCOUNT = 0xFFFF

fCS

Maximum channel sample rate

FDC2112, FDC2114

single active channel continuous

13.3

kSPS

conversion, SCL = 400 kHz

FDC2212, FDC2214

single active channel continuous

4.08

kSPS

conversion, SCL= 400 kHz

EXCITATION

fSENSOR

Sensor excitation frequency

TA = –40°C to +125°C

0.01

MHz

VSENSORMIN

Minimum sensor oscillation

1.2

amplitude (pk)(7)

VSENSORMAX

Maximum sensor oscillation

1.8

amplitude (pk)

ISENSORMAX

Sensor maximum current drive

HIGH_CURRENT_DRV = b0

DRIVE_CURRENT_CH0 =

1.5

0xF800

HIGH_CURRENT_DRV = b1

DRIVE_CURRENT_CH0 =

0xF800

Channel 0 only

MASTER CLOCK

fCLKIN

External master clock input

TA = –40°C to +125°C

MHz

frequency (CLKIN)

CLKINDUTY_MIN

External master clock minimum

40%

acceptable duty cycle (CLKIN)

CLKINDUTY_MAX

External master clock maximum

60%

acceptable duty cycle (CLKIN)

VCLKIN_LO

CLKIN low voltage threshold

0.3*VDD

(1)

Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in

very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables

under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which

the device may be permanently degraded, either mechanically or electrically.

(2)

Register values are represented as either binary (b is the prefix to the digits), or hexadecimal (0x is the prefix to the digits). Decimal

values have no prefix.

(3)

Limits are ensured by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are ensured through

correlations using statistical quality control (SQC) method.

(4)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(5)

I2C read/write communication and pull-up resistors current through SCL, SDA not included.

(6)

Sensor capacitor: 1 layer, 20.9 x 13.9 mm, Bourns CMH322522-180KL sensor inductor with L=18µH and 33pF 1% COG/NP0 Target:

Grounded aluminum plate (176 x 123 mm), Channel = Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b10,

CHx_FREF_DIVIDER = b00 0000 0001 CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800.

(7)

Lower VSENSORMIN oscillation amplitudes can be used, but will result in lower SNR.

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