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MCP8026 Datasheet(PDF) 34 Page - Microchip Technology |
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MCP8026 Datasheet(HTML) 34 Page - Microchip Technology |
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34 / 64 page ![]() MCP8025/6 DS20005339B-page 34 2016 Microchip Technology Inc. 4.3.4.2 Gate Control Logic The gate control logic provides level shifting of the digital inputs, polarity control and cross conduction protection. 4.3.4.2.1 Cross Conduction Protection Logic prevents switching on one power MOSFET while the opposite one in the same half-bridge is already switched on. If both MOSFETs in the same half-bridge are commanded ON simultaneously by the digital inputs, both will be turned off. 4.3.4.2.2 Programmable Dead Time The gate control logic employs a break-before-make dead-time delay that is programmable. A configuration message is provided to configure the driver dead time. The programmable dead times range from 250 ns to 2000 ns (default) in 250 ns increments. The dead time allows the PWM inputs to be direct inversions of each other and still allow proper motor operation. The dead time internally modifies the PWMH/L gate drive timing to prevent cross conduction. The DRVDT<2:0> bits in the CFG2 register are used to set the dead time value. 4.3.4.2.3 Programmable Blanking Time A configuration message is provided to configure the driver current limit blanking time. The blanking time allows the system to ignore any current spikes that may occur when switching the driver outputs. The allowable blanking times are 500 ns, 1 µs, 2 µs and 4 µs (default). The blanking time will start after the dead-time circuitry has timed out. The DRVBT<1:0> bits in the CFG2 register are used to set the blanking time value. The blanking time affects the driver undervoltage lockout. The driver undervoltage lockout latches the external MOSFET undervoltage lockout fault if the undervoltage condition lasts longer than the time specified by the tDUVLO parameter. The tDUVLO parameter takes into account the blanking time if blanking is in progress. 4.4 Chip Enable (CE) The Chip Enable (CE) pin allows the device to be disabled by external control. The Chip Enable pin has four modes of operation. 4.4.1 FAULT CLEARING STATE The CE pin is used to clear any faults and re-enable the driver. After toggling the CE pin low to high, the system requires a minimum time period to re-enable and start up all the driver blocks. The start-up time is approximately 35 μs. The maximum pulse time for the high-low-high transition to clear faults should be less than 1 ms. If the high-low-high transition is longer than 1 ms, the device will start up from the Standby state. Any fault status bits that are set will be cleared by the low-to-high transition of the CE pin if, and only if, the fault condition has ceased to exist. If the fault condition still exists, the active fault status bit will remain active. No additional fault messages will be sent for a fault that remains active. 4.4.2 WAKE FROM SLEEP MODE The CE pin is also used to awaken the device from the Sleep mode state. To wake the device from a Sleep mode state, the CE pin must be set low for a minimum of 250 μs. The device will then wake up with the next rising edge of the CE pin. The LIN bus may be used to wake the device from the Sleep mode state. When a LIN wake-up event is detected on the LIN_BUS pin, the device will wake up. The MCP8025 will wake up on the rising edge of the bus after detecting a dominate state lasting > 150 µs on the bus. The LIN Bus master must provide the dominate state for > 250 µs to meet the LIN 2.2A specifications. TABLE 4-4: ILIMIT_OUT FAULTS Fault DE2 Register Overtemperature 0x85 0x02 Device Input Undervoltage 0x85 0x04 Driver Input Overvoltage 0x85 0x08 Device Input Overvoltage 0x85 0x10 Buck Regulator Output Undervoltage 0x85 0x80 External MOSFET Undervoltage Lockout 0x86 0x04 External MOSFET Overcurrent Detection 0x86 0x08 5V LDO Undervoltage Lockout 0x86 0x20 TABLE 4-5: WARNINGS Fault DE2 Register Temperature Warning 0x85 0x01 Buck Regulator Overcurrent 0x85 0x20 Buck Regulator Undervoltage 0x85 0x40 Brownout – Configuration Lost 0x86 0x10 |
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