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MWCT1004AFVLLPR Datasheet(PDF) 55 Page - NXP Semiconductors |
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MWCT1004AFVLLPR Datasheet(HTML) 55 Page - NXP Semiconductors |
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55 / 65 page ![]() J2 J3 J3 J4 J4 TCLK (input) Figure 24. Test clock input timing J7 J9 J5 J6 Input data valid Output data valid TCLK Data inputs Data outputs Data outputs J8 Figure 25. Boundary scan (JTAG) timing Debug modules MWCT101XS Data Sheet, Rev. 3, 12/2019 NXP Semiconductors 55 |
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