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MWCT1004AFVLLPR Datasheet(PDF) 1 Page - NXP Semiconductors

Part # MWCT1004AFVLLPR
Description  Memory and memory interfaces
PDF  65 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MWCT1004AFVLLPR Datasheet(HTML) 1 Page - NXP Semiconductors

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MWCT101XSF
MWCT101XS Data Sheet
Key Features
• Operating characteristics
– Voltage range: 2.7 V to 5.5 V
– Ambient temperature range: -40 °C to 105 °C for
HSRUN mode, -40 °C to 125 °C for RUN mode
• Arm™ Cortex-M4F core, 32-bit CPU
– Supports up to 112 MHz frequency (HSRUN) with
1.25 Dhrystone MIPS per MHz
– Arm Core based on the Armv7 Architecture and
Thumb®-2 ISA
– Integrated Digital Signal Processor (DSP)
– Configurable Nested Vectored Interrupt Controller
(NVIC)
– Single Precision Floating Point Unit (FPU)
• Clock interfaces
– 4 - 40 MHz fast external oscillator (SOSC)
– 48 MHz Fast Internal RC oscillator (FIRC)
– 8 MHz Slow Internal RC oscillator (SIRC)
– 128 kHz Low Power Oscillator (LPO)
– Up to 112 MHz (HSRUN) System Phased Lock
Loop (SPLL)
– Up to 50 MHz DC external square wave input clock
– Real Time Counter (RTC)
• Power management
– Low-power Arm Cortex-M4F core with excellent
energy efficiency
– Power Management Controller (PMC) with multiple
power modes: HSRUN, RUN, STOP, VLPR, and
VLPS. Note: CSEc (Security) or EEPROM writes/
erase will trigger error flags in HSRUN mode (112
MHz) because this use case is not allowed to
execute simultaneously. The device will need to
switch to RUN mode (80 Mhz) to execute CSEc
(Security) or EEPROM writes/erase.
– Clock gating and low power operation supported on
specific peripherals.
• Memory and memory interfaces
– Up to 2 MB program flash memory with ECC
– 64 KB FlexNVM for data flash memory with ECC
and EEPROM emulation. Note: CSEc (Security) or
EEPROM writes/erase will trigger error flags in
HSRUN mode (112 MHz) because this use case is
not allowed to execute simultaneously. The device
will need to switch to RUN mode (80 MHz) to
execute CSEc (Security) or EEPROM writes/erase.
– Up to 256 KB SRAM with ECC
– Up to 4 KB of FlexRAM for use as SRAM or
EEPROM emulation
– Up to 4 KB Code cache to minimize performance
impact of memory access latencies
– QuadSPI with HyperBus™ support
• Mixed-signal analog
– Up to two 12-bit Analog-to-Digital Converter
(ADC) with up to 32 channel analog inputs per
module
– One Analog Comparator (CMP) with internal 8-bit
Digital to Analog Converter (DAC)
• Debug functionality
– Serial Wire JTAG Debug Port (SWJ-DP) combines
– Debug Watchpoint and Trace (DWT)
– Instrumentation Trace Macrocell (ITM)
– Test Port Interface Unit (TPIU)
– Flash Patch and Breakpoint (FPB) Unit
• Human-machine interface (HMI)
– Up to 89 GPIO pins with interrupt functionality
– Non-Maskable Interrupt (NMI)
NXP Semiconductors
Document Number MWCT101XSF
Data Sheet: Advance Information
Rev. 3, 12/2019
This document contains information on a pre-production product. Specifications
and pre-production information herein are subject to change without notice.


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