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SN74LVC541APWR Datasheet(PDF) 16 Page - Texas Instruments

Part # SN74LVC541APWR
Description  SNx4LVC541A Octal Buffers/Drivers With 3-State Outputs
PDF  46 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

SN74LVC541APWR Datasheet(HTML) 16 Page - Texas Instruments

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9 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions are listed below.
9.1 Documentation Support
9.1.1 Related Documentation
For related documentation, see the following:
• Texas Instruments, CMOS Power Consumption and Cpd Calculation application note
• Texas Instruments, Designing With Logic application note
• Texas Instruments, Thermal Characteristics of Standard Linear and Logic (SLL) Packages and Devices
application note
9.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Notifications to register and receive a weekly digest of any product information that has changed. For change
details, review the revision history included in any revised document.
9.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
9.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
10 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from June 1, 2014 to June 17, 2026 (from Revision N (June 2014) to Revision O (June
2026))
Page
• Updated the numbering format for tables, figures, and cross-references throughout the document................. 1
• Moved ESD ratings to ESD Ratings table.......................................................................................................... 1
• Updated latch-up ratings to latest standards...................................................................................................... 1
• Updated Device Information format and included package size........................................................................ 1
• Updated Simplified Schematic ...........................................................................................................................1
• Updated Applications .........................................................................................................................................1
• Added DGS and RKS package information........................................................................................................1
• Changed RθJA for DB package from: 112.1°C/W to: 121.7°C/W.......................................................................6
• Changed RθJC(top) for DB package from: 73.6°C/W to: 86.8°C/W...................................................................6
SN54LVC541A, SN74LVC541A
SCAS298O – JANUARY 1993 – REVISED JUNE 2026
www.ti.com
16
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Copyright © 2026 Texas Instruments Incorporated
Product Folder Links: SN54LVC541A SN74LVC541A



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