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SN74LVC541APWR Datasheet(PDF) 16 Page - Texas Instruments |
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SN74LVC541APWR Datasheet(HTML) 16 Page - Texas Instruments |
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16 / 46 page ![]() 9 Device and Documentation Support TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device, generate code, and develop solutions are listed below. 9.1 Documentation Support 9.1.1 Related Documentation For related documentation, see the following: • Texas Instruments, CMOS Power Consumption and Cpd Calculation application note • Texas Instruments, Designing With Logic application note • Texas Instruments, Thermal Characteristics of Standard Linear and Logic (SLL) Packages and Devices application note 9.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Notifications to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 9.3 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 9.4 Trademarks TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners. 9.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 9.6 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. 10 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from June 1, 2014 to June 17, 2026 (from Revision N (June 2014) to Revision O (June 2026)) Page • Updated the numbering format for tables, figures, and cross-references throughout the document................. 1 • Moved ESD ratings to ESD Ratings table.......................................................................................................... 1 • Updated latch-up ratings to latest standards...................................................................................................... 1 • Updated Device Information format and included package size........................................................................ 1 • Updated Simplified Schematic ...........................................................................................................................1 • Updated Applications .........................................................................................................................................1 • Added DGS and RKS package information........................................................................................................1 • Changed RθJA for DB package from: 112.1°C/W to: 121.7°C/W.......................................................................6 • Changed RθJC(top) for DB package from: 73.6°C/W to: 86.8°C/W...................................................................6 SN54LVC541A, SN74LVC541A SCAS298O – JANUARY 1993 – REVISED JUNE 2026 www.ti.com 16 Submit Document Feedback Copyright © 2026 Texas Instruments Incorporated Product Folder Links: SN54LVC541A SN74LVC541A |
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