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REF53-Q1 Datasheet(PDF) 10 Page - Texas Instruments

Part # REF53-Q1
Description  REF53-Q1, 4ppm/°C Maximum Drift, 3ppmp-p 1/f Noise, 85μA Current, 30mA Load Current, Precision Voltage Reference
PDF  28 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

REF53-Q1 Datasheet(HTML) 10 Page - Texas Instruments

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7 Parameter Measurement Information
7.1 Temperature Drift
The REF53-Q1 is designed and tested for a minimal output voltage temperature drift, which is defined as the
change in output voltage over temperature. Every unit shipped is tested at multiple temperatures to make sure
that the product meets datasheet specifications. The temperature coefficient is calculated using the box method
in which a box is formed by the minimum and maximum limits for the nominal output voltage over the operating
temperature range. REF53-Q1 device has maximum temperature coefficient of 4ppm/°C from -40°C to 125°C.
The box method specifies limits for the temperature error but does not specify the exact shape and slope of the
device under test. Due to temperature curvature correction to achieve low-temperature drift, the temperature drift
is expected to be non-linear. See the analog design journal Precision Voltage References for more information
on the box method. The box method equation is in Equation 1:
Drift= VREF(MAX)−VREF(MIN)
VREF(25∘C)×Temperature Range ×106
(1)
Figure 7-1. Output Voltage vs Free-Air Temperature
7.2 Long-Term Stability
Long-term stability is a key performance parameter for series voltage references in all precision applications.
This is defined as variation of reference voltage over time. The long-term stability value is tested in a typical
setup that reflects standard PCB board manufacturing practices. The boards are made of standard FR4 material,
the board does not have special cuts or grooves around the devices or go through burn-in process to relieve the
mechanical stress of the PCB. These conditions reflect real world use case scenario and common manufacturing
techniques.
During the long-term stability testing, precautions are taken to make sure that only the long-term stability drift is
being measured. The boards are maintained at 35°C ± 0.02°C in an oil bath. The oil bath makes sure that the
temperature is constant across the device over time. The measurements are captured every 30 minutes with a
calibrated 8.5 digit multimeter.
Typical long-term stability characteristic are expressed as a deviation over time. Figure 7-2 shows the typical drift
value for the REF53-Q1 VREF is 25ppm from 0 to 1000 hours.
REF53-Q1
SNVSCU8 – AUGUST 2026
www.ti.com
10
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Copyright © 2026 Texas Instruments Incorporated
Product Folder Links: REF53-Q1



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