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TLK6002 Datasheet(PDF) 93 Page - Texas Instruments |
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TLK6002 Datasheet(HTML) 93 Page - Texas Instruments |
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93 / 96 page  TLK6002 www.ti.com SLLSE34 – MAY 2010 9 Appendix E – Device Test Modes This device can be placed into one of the four modes: functional mode including JTAG testing mode, scan 1 testing mode, scan 2 testing mode, and Cooper/eFuse testing mode. The scan 1, scan 2 and Cooper/eFuse testing modes are for TI use only, and may be ignored by external users of this device. Table 9-1. Device Mode Configuration FUNCTIONAL DEVICE FUNCTIONAL MODE/JTAG SCAN 1 MODE SCAN 2 MODE COOPER/EFUSE MODE PIN NAME TESTING TESTEN 0 0 1 1 GPI0 0 1 0 1 Table 9-2. Device Test Mode Pin Configuration FUNCTIONAL FUNCTIONAL TEST MODE FUNCTIONAL COOPER/EFUSE DEVICE PIN MODE SIGNAL SIGNAL MODE/JTAG SCAN 1 MODE SCAN 2 MODE MODE NAME DIRECTION DIRECTION TESTING CODEA_EN I I CODEA_EN Scan In 8 Scan In 8 STCICFG0 RATE_A2 I I RATE_A2 Scan In 7 Scan In 7 STCI_D RATE_A1 I I RATE_A1 Scan In 6 Scan In 6 EFUSE_TMS RATE_A0 I I RATE_A0 Scan In 5 Scan In 5 EFUSE_TDI RATE_B2 I I RATE_B2 Scan In 4 Scan In 4 STCICFG1 RATE_B1 I I RATE_B1 Scan In 3 Scan In 3 EFUSE_INITZ RATE_B0 I I RATE_B0 Scan In 2 Scan In 2 EFUSE_TRST REFCLK_A_SEL I I REFCLK_A_SEL Scan In 1 Scan In 1 REFCLK_A_SEL REFCLK_B_SEL I I REFCLK_B_SEL Scan Enable Scan Enable REFCLK_B_SEL CLK_OUT_SEL I I CLK_OUT_SEL At Speed Scan Enable HSTL Force Up EFUSE_TCK 0: stuck-at fault 1: transition fault CODEB_EN I I CODEB_EN Scan Clock Select (0: HSTL Force Down EFUSE_SYS_CLK from device pin, 1: from Cooper), also EFUSE_SYS_CLK TDI I I TDI Adaptive Scan Enable Adaptive Scan TDI (Test Mode) Enable (Test Mode) PRBS_EN I I PRBS_EN Scan Clock Scan Clock STCICLK PRTAD4 I O or I PRTAD4 Scan Out 8 (O) Scan Out 8 (O) TESTCLK_R (I) PRTAD3 I O or I PRTAD3 Scan Out 7 (O) Scan Out 7 (O) efuse_cooper_sel (I) (0: Cooper mode, 1: eFuse mode) PRTAD2 I O or I PRTAD2 Scan Out 6 (O) Scan Out 6 (O) TESTCLK_T (I) PRTAD1 I O or I PRTAD1 Scan Out 5 (O) Scan Out 5 (O) Not Used (I) PRTAD0 I O or I PRTAD0 Scan Out 4 (O) Scan Out 4 (O) Not Used (I) PRBSA_PASS O O PRBSA_PASS Scan Out 3 (O) Scan Out 3 (O) Tied Low LOSA O O LOSA Scan Out 2 (O) Scan Out 2 (O) STCI_Q PRBSB_PASS O O PRBSB_PASS Scan Out 1 (O) Scan Out 1 (O) EFUSE_TDO LOSB O O LOSB Burnin_Output Burnin_Output Burnin_Output Copyright © 2010, Texas Instruments Incorporated Appendix E – Device Test Modes 93 Submit Documentation Feedback Product Folder Link(s): TLK6002 |
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