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CY8C52 Datasheet(PDF) 80 Page - Cypress Semiconductor |
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CY8C52 Datasheet(HTML) 80 Page - Cypress Semiconductor |
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80 / 94 page ![]() PRELIMINARY PSoC® 5: CY8C52 Family Datasheet Document Number: 001-66236 Rev. ** Page 80 of 94 Figure 11-45. Clock to Output Performance 11.4 Memory Specifications are valid for –40 °C ≤ TA ≤ 85 °C and TJ ≤ 100 °C, except where noted. Specifications are valid for 1.71 V to 5.5 V, except where noted. 11.4.1 Flash 11.4.2 EEPROM Table 11-43. Flash DC Specifications Parameter Description Conditions Min Typ Max Units Erase and program voltage VDDD pin 1.71 – 5.5 V Table 11-44. Flash AC Specifications Parameter Description Conditions Min Typ Max Units TWRITE Row write time (erase + program) – 15 20 ms TERASE Row erase time – 10 13 ms Row program time – 5 7 ms TBULK Bulk erase time (256 KB) – – 320 ms Sector erase time (16 KB) – – 15 ms Total device program time (including JTAG or SWD and other overhead) – – 20 Seconds Flash data retention time, retention period measured from last erase cycle Average ambient temp. TA ≤ 55 °C, 100 K erase/program cycles 20 – – Years –40 °C ≤ TA ≤ 85 °C, 10 K erase/program cycles 10 – – Table 11-45. EEPROM DC Specifications Parameter Description Conditions Min Typ Max Units Erase and program voltage 1.71 – 5.5 V [+] Feedback [+] Feedback [+] Feedback |
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