DSPIC30F4012 datasheet(177/238 Pages) MICROCHIP

177 / 238 page

DS70135G-page 177

dsPIC30F4011/4012

24.0

ELECTRICAL CHARACTERISTICS

This section provides an overview of dsPIC30F electrical characteristics. Additional information will be provided in future

revisions of this document as it becomes available.

For detailed information about the dsPIC30F architecture and core, refer to the “dsPIC30F Family Reference Manual”

(DS70046).

Absolute maximum ratings for the dsPIC30F family are listed below. Exposure to these maximum rating conditions for

extended periods may affect device reliability. Functional operation of the device at these or any other conditions above

the parameters indicated in the operation listings of this specification is not implied.

Absolute Maximum Ratings(†)

Ambient temperature under bias............................................................................................................ .-40°C to +125°C

Storage temperature .............................................................................................................................. -65°C to +150°C

Voltage on any pin with respect to VSS (except VDD and MCLR) (Note 1) ..................................... -0.3V to (VDD + 0.3V)

Voltage on VDD with respect to VSS ......................................................................................................... -0.3V to +5.5V

Voltage on MCLR with respect to VSS ....................................................................................................... 0V to +13.25V

Maximum current out of VSS pin ...........................................................................................................................300 mA

Maximum current into VDD pin (Note 2)................................................................................................................ 250 mA

Input clamp current, IIK (VI < 0 or VI > VDD) .......................................................................................................... ±20 mA

Output clamp current, IOK (VO < 0 or VO > VDD) ................................................................................................... ±20 mA

Maximum output current sunk by any I/O pin..........................................................................................................25 mA

Maximum output current sourced by any I/O pin ....................................................................................................25 mA

Maximum current sunk by all ports ....................................................................................................................... 200 mA

Maximum current sourced by all ports (Note 2).................................................................................................... 200 mA

Note 1: Voltage spikes below VSS at the MCLR pin, inducing currents greater than 80 mA, may cause latch-up.

Thus, a series resistor of 50-100

Ωshould be used when applying a “low” level to the MCLR/ pin, rather than

pulling this pin directly to VSS.

2: Maximum allowable current is a function of device maximum power dissipation (see Table 24-2).

†NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions above those

indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for

extended periods may affect device reliability.

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