EPF8282AV datasheet(27/62 Pages) ALTERA

27 / 62 page

Altera Corporation

FLEX 8000 Programmable Logic Device Family Data Sheet

Figure 15. FLEX 8000 AC Test Conditions

Operating

Conditions

Tables 9 through 12 provide information on absolute maximum ratings,

recommended operating conditions, operating conditions, and

capacitance for 5.0-V FLEX 8000 devices.

VCC

To Test

System

C1 (includes

JIG capacitance)

Device input

rise and fall

times < 3 ns

464

Ω

(703

Ω)

Device

Output

250

Ω

(8.06 K

Ω)

Power supply transients can affect AC

measurements. Simultaneous transitions

of multiple outputs should be avoided for

accurate measurement. Threshold tests

must not be performed under AC

conditions. Large-amplitude, fast-ground-

current transients normally occur as the

device outputs discharge the load

capacitances. When these transients flow

through the parasitic inductance between

the device ground pin and the test system

ground, significant reductions in

observable noise immunity can result.

Numbers in parentheses are for 3.3-V

devices or outputs. Numbers without

parentheses are for 5.0-V devices or

outputs.

Table 9. FLEX 8000 5.0-V Device Absolute Maximum Ratings

Note (1)

Symbol

Parameter

Conditions

Min

Max

Unit

VCC

Supply voltage

With respect to ground (2)

–2.0

7.0

DC input voltage

–2.0

7.0

I OUT

DC output current, per pin

–25

T STG

Storage temperature

No bias

–65

150

° C

T AMB

Ambient temperature

Under bias

–65

135

° C

T J

Junction temperature

Ceramic packages, under bias

150

° C

PQFP and RQFP, under bias

135

° C

EPF8282AV Datasheet(PDF) 27 Page - Altera Corporation

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