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AN4599 Datasheet(PDF) 14 Page - STMicroelectronics |
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AN4599 Datasheet(HTML) 14 Page - STMicroelectronics |
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14 / 26 page  Functional and thermal test AN4599 14/26 DocID026993 Rev 1 5 Functional and thermal test All the measurements are typical and performed at 30 °C ambient temperature. Thermal testing is performed starting with a power of 100 W applied for 30 min. Table 3. Functional and thermal test Test 190 Vac 230 Vac 265 Vac Functional Tstart (sec) 3.9 3 2.2 Functional Pin no load (W) 1 0.6 0.5 Functional ƞ@load 6.5 A (%) 91 92 93 Functional ƞ@load 3.5 A (%) 91.5 92.5 93.5 Functional Freq @ load6.5A (kHz 66 80 98 Functional ILimit (A) 12 13.5 16 Thermal Delay time thermal protection 200 W (sec) 45 Thermal Delay time thermal protection 250 W (sec) 32 |
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