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NX3L1G53 Datasheet(PDF) 7 Page - NXP Semiconductors |
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NX3L1G53 Datasheet(HTML) 7 Page - NXP Semiconductors |
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7 / 24 page ![]() NX3L1G53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 7 — 8 February 2013 7 of 24 NXP Semiconductors NX3L1G53 Low-ohmic single-pole double-throw analog switch 11.1 Test circuits VI =0.3V orVCC 0.3 V; VO =VCC 0.3 V or 0.3 V. Fig 6. Test circuit for measuring OFF-state leakage current VO IS 001aad390 S Z E Y0 Y1 VCC GND switch switch 1 1 2 2 VIH VIL S VIH VIH E VI VIL or VIH VIH VI =0.3V orVCC 0.3 V; VO = open circuit. Fig 7. Test circuit for measuring ON-state leakage current IS 001aad391 S Z E Y0 Y1 VCC GND VI VIL or VIH VIL switch 1 2VIH VIL S VIL VIL E VO switch 1 2 |
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