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NX3L1G53 Datasheet(PDF) 17 Page - NXP Semiconductors |
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NX3L1G53 Datasheet(HTML) 17 Page - NXP Semiconductors |
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17 / 24 page ![]() NX3L1G53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 7 — 8 February 2013 17 of 24 NXP Semiconductors NX3L1G53 Low-ohmic single-pole double-throw analog switch a. Test circuit b. Input and output pulse definitions Qinj = VO CL. V O = output voltage variation. Rgen = generator resistance. Vgen = generator voltage. VI may be connected to S or E. Fig 24. Test circuit for measuring charge injection 001aad398 S Z Y0 Y1 RL CL VCC GND Rgen Vgen switch 1 2 VI VO E VIL G 001aah451 ΔVO off off on VO logic input (S, E) |
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