KAI-2001 datasheet(17/36 Pages) ONSEMI

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KAI−2001

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TEST DEFINITIONS

Test Regions of Interest

Active Area ROI:

Pixel (1, 1) to Pixel (1600, 1200)

Center 100 by 100 ROI:

Pixel (750, 550) to

Pixel (849, 649)

Only the active pixels are used for performance and defect

tests.

Overclocking

The test system timing is configured such that the sensor

is overclocked in both the vertical and horizontal directions.

See Figure 16 for a pictorial representation of the regions.

Figure 16. Overclock Regions of Interest

Pixel 1,1

Vertical Overclock

Tests

Dark Field Center Non-Uniformity

This test is performed under dark field conditions. Only

the center 100 by 100 pixels of the sensor are used for this

test − pixel (750, 550) to pixel (849, 649).

Dark Field Center Uniformity

+ Standard Deviation of Center 100 by 100 Pixels in Electrons @

DPS Integration Time

Actual Integration Time Used

Units: mV rms. DPS Integration Time: Device Performance Specification Integration Time = 33 ms.

Dark Field Global Non-Uniformity

This test is performed under dark field conditions.

The sensor is partitioned into 192 sub regions of interest,

each of which is 100 by 100 pixels in size. See Figure 17.

The average signal level of each of the 192 sub regions of

interest is calculated. The signal level of each of the sub

regions of interest is calculated using the following formula:

Signal of ROI[i]

+ (ROI Average in ADU *

Units : mVpp (millivolts Peak to Peak)

* Horizontal Overclock Average in ADU) @

@ mV per Count

Where i = 1 to 192. During this calculation on the 192 sub

regions of interest, the maximum and minimum signal levels

are found. The dark field global uniformity is then calculated

as the maximum signal found minus the minimum signal

level found.

Global Non-Uniformity

This test is performed with the imager illuminated to

a level such that the output is at 80% of saturation

(approximately 32,000 electrons). Prior to this test being

performed the substrate voltage has been set such that the

charge capacity of the sensor is 40,000 electrons. Global

uniformity is defined as:

Global Uniformity

+ 100 @

Active Area Standard Deviation

Active Area Signal

Active Area Signal = Active Area Average − H. Overclock Average

Units : % rms

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