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RHFL6000A Datasheet(PDF) 14 Page - STMicroelectronics |
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RHFL6000A Datasheet(HTML) 14 Page - STMicroelectronics |
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14 / 31 page ![]() Radiations RHFL6000A 14/31 DocID028379 Rev 2 6.2 Heavy Ions The heavy ions trials are performed on qualification lots only. No additional test is performed. Table 7 summarizes the results of heavy ions tests. Table 7: Heavy ions results Feature Conditions Value Unit SEL/B performance LET = 120 MeV*cm2/mg VI = 12 V No latchup/burnout - SET performance during events LET = 32 MeV*cm2/mg Saturated cross-section = 6.18*10-5 cm² VIN up to 9 V VI - VO ≤ 7.5 V IOUT < 300 mA ± 15% max over less than 300 ns % of VO LET = 120 MeV*cm2/mg VIN up to 12 V VI - VO < 3.0 V IOUT < 300 mA No SET above ± 3% LET = 120 MeV*cm2/mg VIN up to 4 V VI - VO < 1.5 V IOUT < 1 A No SET above ± 3.3% SEL and SET performances described here below are related to the circuit configuration and bias conditions shown in Figure 4: "Heavy Ion test configuration" and Table 8: "Bias configurations" and Table 9: "Test configurations". Figure 4: Heavy Ions test configuration |
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