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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.

SN74LVTH16373-EP

SCBS778B – NOVEMBER 2003 – REVISED JUNE 2016

SN74LVTH16373-EP 3.3-V ABT 16-Bit Transparent D-Type Latch With Tri-State Outputs

1

1 Features

1

•

Controlled Baseline

–

One Assembly/Test Site, One Fabrication Site

•

Enhanced Diminishing Manufacturing Sources

(DMS) Support

•

Enhanced Product-Change Notification

•

•

Member of the Texas Instruments Widebus™

Family

•

State-of-the-Art Advanced BiCMOS Technology

(ABT) Design for 3.3-V Operation and Low Static-

Power Dissipation

•

Supports Mixed-Mode Signal Operation (5-V Input

•

Supports Unregulated Battery Operation Down to

2.7 V

•

•

•

Bus Hold on Data Inputs Eliminates the Need for

External Pullup/Pulldown Resistors

•

Speed Switching Noise

•

Flow-Through Architecture Optimizes PCB Layout

•

Latch-Up Performance Exceeds 500 mA Per

JESD 17

•

ESD Protection Exceeds JESD 22

–

4000-V Human Body Model (A114-A)

–

200-V Machine Model (A115-A)

2 Applications

•

Data Buffer

•

Bus Driver

•

Display Driver

3 Description

The SN74LVTH16373 is a 16-bit transparent D-type

latch with tri-state outputs designed for low-voltage

provide a TTL interface to a 5-V system environment.

This device is particularly suitable for implementing

buffer registers, I/O ports, bidirectional bus drivers,

and working registers. This device can be used as

two 8-bit latches or one 16-bit latch. When the latch-

enable (LE) input is high, the Q outputs follow the

data (D) inputs. When LE is taken low, the Q outputs

are latched at the levels set up at the D inputs.

Device Information(2)

PART NUMBER

PACKAGE

BODY SIZE (NOM)

SN74LVTH16373-EP

TSSOP (48)

12.50 mm × 6.10 mm

SSOP (48)

15.88 mm × 7.49 mm

BGA MICROSTAR

JUNIOR (56)

4.50 mm × 7.00 mm

(1) Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature

cycle,

autoclave

or

unbiased

HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying

use

of

this

component

beyond

specified

performance and environmental limits.

(2) For all available packages, see the orderable addendum at

the end of the data sheet.

SN74LVTH16373-EP Single Channel Block Diagram