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L9961 Datasheet(PDF) 36 Page - STMicroelectronics

Part # L9961
Description  Battery management system solution
PDF  63 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9961 Datasheet(HTML) 36 Page - STMicroelectronics

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3.8
Digital IOs (RDY/SDA/SCL/FAULTN_SAFE/FAULTN/OD)
The following paragraph lists the electrical characteristics of the device digital IOs.
3.8.1
Data-ready interrupt pin (RDY)
The RDY pin is used to signal the system MCU when new data is available. The RDY signal is a positive pulse
lasting TRDY_PULSE upon the following events:
•
After each Section 3.4 Voltage conversion routine task is completed (as shown in Figure 11. I2C clock
polarity)
•
If the Coulomb counter saturates (upon CC_SAT flag positive edge, see Section 3.5.2 Coulomb counting)
•
Any time the device enters NORMAL state
Figure 10. RDY pulse generation upon voltage conversion routine task termination
GADG220620221329SA
3.8.1.1
Electrical parameters
All parameters are tested and guaranteed in the following conditions, unless otherwise noted:
VB according operating range of Table 4; TJ according operating range of Table 7.
Table 27. RDY Interrupt pin electrical parameters
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Pin
TRDY_PULSE
RDY interruput pulse duration
Tested by SCAN
85
104
120
us
RDY
3.8.2
Fault interrupt pin (FAULTN)
The FAULTN pin indicates when a failure is detected . FAULTN is an open-drain output active low.
Several failures can be redirected to FAULTN line depending on their masking bit. Refer to Section 3.4 Voltage
conversion routine and Section 3.5 Current conversion routine for a list of specific failures.
FAULTN can also be used by a secondary protector in order to disconnect the battery pack from the load or the
charger. When not internally pulled low, FAULTN can be externally pulled low for TFAULTN_LOW: L9961 will force
the CHG/DCHG outputs low, regardless of CHG_ON and DCHG_ON commands and L9961 internal diagnostics.
The event is latched by FAULTN_EXT bit. CHG/DCHG will be released upon flag clear by MCU.
L9961
Digital IOs (RDY/SDA/SCL/FAULTN_SAFE/FAULTN/OD)
DS14012 - Rev 1
page 36/63



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