LSM6DSO16IS datasheet(9/107 Pages) STMICROELECTRONICS

9 / 107 page

Symbol

Parameter

Test conditions

Min.

(1)

Typ.(2)

Max.

(1)

Unit

RMS

Acceleration RMS noise in low-power mode(9)(10)

FS = ±16 g

mg(RMS)

3.0

LA_ODR Linear acceleration output data rate

1.6(11)

12.5

104

208

416

833

1667

3333

6667

G_ODR

Angular rate output data rate

12.5

104

208

416

833

1667

3333

6667

Vst

Linear acceleration self-test output change(12)(13)(14)

1700

Angular rate self-test output change(15)(16)

FS = ±250 dps

dps

FS = ±2000 dps

150

700

dps

Top

Operating temperature range

-40

+85

°C

1. Min/Max values are based on characterization results at 3σ on a limited number of samples, not tested in production and not

guaranteed.

2. Typical specifications are not guaranteed.

3. Sensitivity values after factory calibration test and trimming.

4. Values after factory calibration test and trimming.

5. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited

number of samples. Not measured during final test for production.

6. Gyroscope rate noise density in high-performance mode is independent of the ODR and FS setting.

7. Gyroscope RMS noise in low-power mode is independent of the ODR and FS setting.

8. Accelerometer noise density in high-performance mode is independent of the ODR.

9. Accelerometer RMS noise in low-power mode is independent of the ODR.

10. Noise RMS related to BW = ODR/2.

11. This ODR is available when the accelerometer is in low-power mode.

12. The sign of the linear acceleration self-test output change is defined by the STx_XL bits in a dedicated register for all axes.

13. The linear acceleration self-test output change is defined with the device in stationary condition as the absolute value of:

OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 0.061 mg at ±2 g full scale.

14. Accelerometer self-test limits are full-scale independent.

15. The sign of the angular rate self-test output change is defined by the STx_G bits in a dedicated register for all axes.

16. The angular rate self-test output change is defined with the device in stationary condition as the absolute value of:

OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 70 mdps at ±2000 dps full scale.

LSM6DSO16IS

Mechanical characteristics

DS13892 - Rev 2

page 9/107

LSM6DSO16IS Datasheet(PDF) 9 Page - STMicroelectronics

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