STM32L4S5AI datasheet(240/275 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32L4S5xx, STM32L4S7xx and STM32L4S9xx

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DocID030322 Rev 2

Figure 55. NAND controller waveforms for common memory write access

6.3.32

OctoSPI characteristics

Unless otherwise specified, the parameters given in Table 111, Table 112 and Table 113 for

OctoSPI are derived from tests performed under the ambient temperature, fAHB frequency

Table 109. Switching characteristics for NAND Flash read cycles(1)(2)

1. CL = 30 pF.

2. Guaranteed by characterization results.

Symbol

Parameter

Min

Max

Unit

Tw(N0E)

FMC_NOE low width

4THCLK-0.5 4THCLK+0.5

Tsu(D-NOE)

FMC_D[15-0] valid data before FMC_NOE high

Th(NOE-D)

FMC_D[15-0] valid data after FMC_NOE high

Td(NCE-NOE) FMC_NCE valid before FMC_NOE low

3THCLK+1

Th(NOE-ALE)

FMC_NOE high to FMC_ALE invalid

3THCLK-0.5

Table 110. Switching characteristics for NAND Flash write cycles(1)(2)

1. CL = 30 pF.

2. Guaranteed by characterization results.

Symbol

Parameter

Min

Max

Unit

Tw(NWE)

FMC_NWE low width

2THCLK-0.5

4THCLK+0.5

Tv(NWE-D)

FMC_NWE low to FMC_D[15-0] valid

Th(NWE-D)

FMC_NWE high to FMC_D[15-0] invalid

2THCLK-1

Td(D-NWE)

FMC_D[15-0] valid before FMC_NWE high

5THCLK-1

Td(NCE_NWE)

FMC_NCE valid before FMC_NWE low

3THCLK-1

Th(NWE-ALE)

FMC_NWE high to FMC_ALE invalid

3THCLK-0.5

MSv38006V1

tw(NWE)

th(NWE-D)

tv(NWE-D)

FMC_NWE

FMC_NOE

FMC_D[15:0]

td(D-NWE)

ALE (FMC_A17)

CLE (FMC_A16)

FMC_NCEx

td(NCE-NWE)

th(NOE-ALE)

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