ADC0820-N

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SNAS529C – JUNE 1999 – REVISED MARCH 2013

ADC0820-N 8-Bit High Speed µP Compatible A/D Converter with Track/Hold Function

Check for Samples: ADC0820-N

1

FEATURES

KEY SPECIFICATIONS

2

•

Built-In Track-and-Hold Function

•

Resolution: 8 Bits

•

No Missing Codes

•

Conversion Time

•

No External Clocking

–

2.5 µs Max (RD Mode)

•

Single Supply—5 VDC

–

1.5 µs Max (WR-RD Mode)

•

Easy Interface to All Microprocessors, or

•

Low Power: 75 mW Max

Operates Stand-Alone

•

Total Unadjusted Error: ±½ LSB and ± 1 LSB

•

Latched TRI-STATE Output

DESCRIPTION

•

Logic Inputs and Outputs Meet Both MOS and

By using a half-flash conversion technique, the 8-bit

T2L Voltage Level Specifications

ADC0820-N CMOS A/D offers a 1.5 µs conversion

•

Operates Ratiometrically or with any

time and dissipates only 75 mW of power. The half-

Reference Value Equal to or Less than VCC

flash technique consists of 32 comparators, a most

•

0V to 5V Analog Input Voltage Range with

significant 4-bit ADC and a least significant 4-bit

Single 5V Supply

ADC.

•

No Zero or Full-Scale Adjust Required

The input to the ADC0820-N is tracked and held by

•

Overflow Output Available for Cascading

the input sampling circuitry eliminating the need for

an external sample-and-hold for signals moving at

•

0.3 in. Standard Width 20-Pin PDIP

less than 100 mV/µs.

•

20-Pin PLCC

For

ease

of

interface

to

microprocessors,

the

•

20-Pin SOIC

ADC0820-N has been designed to appear as a

memory location or I/O port without the need for

external interfacing logic.

Connection and Functional Diagrams

Figure 1. CDIP, PDIP,

Figure 2. PLCC Package

and SOIC Packages (Top View)

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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

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PRODUCTION DATA information is current as of publication date.

Copyright © 1999–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.