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6

©2003 Fairchild Semiconductor Corporation

FQP10N60C / FQPF10N60C Rev C1

Figure 12. Gate Charge Test Circuit & Waveform

Figure 13. Resistive Switching Test Circuit & Waveforms

Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms

V

VGS

GS

V

VDS

DS

10

10%

%

90%

90%

tt

d(

d(on

on))

tt

rr

tt onon

tt ofofff

tt

d(

d(ooffff))

ttff

V

VDD

DD

V

VDS

DS

R

RLL

DU

DUTT

R

RGG

V

VGS

GS

Cha

Charrge

ge

V

VGS

GS

Q

Qgg

Q

Qgsgs

Q

Qgd

gd

V

VGS

GS

DU

DUTT

V

VDS

DS

300n

300nFF

50K

50KΩ

Ω

200n

200nFF

12V

12V

Sam

Samee TTyype

pe

as

as DU

DUTT

===

E

E

EAS

AS

AS

--

--

--

--

2

1

2

1

2

1

2

1-------- LLL

AS

AS

AS

III

BV

BVDSS

DSS

222

--------------------

--------------------

BV

BVDS

DSS

S -V

-VDD

DD

V

VDD

DD

V

VDS

DS

BV

BVDS

DSS

S

tt pp

V

VDD

DD

IIAS

AS

V

VDS

DS (t)

(t)

IIDD (t)

(t)

Ti

Tim

mee

DUT

DUT

R

RGG

LLL

III DDD

tt pp

IG = const.

V

VGS

GS

V

VGS

GS