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FQP8N60C. Datasheet(PDF) 2 Page - ON Semiconductor |
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FQP8N60C. Datasheet(HTML) 2 Page - ON Semiconductor |
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2 / 12 page ![]() November 2013 ©2003 Fairchild Semiconductor Corporation FQP10N60C / FQPF10N60C Rev C1 www.fairchildsemi.com 1 FQP10N60C / FQPF10N60C N-Channel QFET® MOSFET 600 V, 9.5 A, 730 mΩ Description These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to mini-mize on-state resistance, provide superior switching perfor-mance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high effi-ciency switched mode power supplies, active power factor correction, electronic lamp ballasts based on half bridge topology. Features • 9.5 A, 600 V, RDS(on) = 730 mΩ (Max.) @ VGS = 10 V, ID = 4.75 A • Low Gate Charge (Typ. 44 nC) • Low Crss (Typ. 18 pF) • 100% Avalanche Tested Absolute Maximum Ratings T C = 25 oC unless otherwise noted. TO-220 GDS TO-220F GD S G S D * Drain current limited by maximum junction temperature. Thermal Characteristics Symbol Parameter FQP10N60C FQPF10N60C Unit VDSS Drain-Source Voltage 600 V ID Drain Current - Continuous (TC = 25°C) 9.5 9.5 * A - Continuous (TC = 100°C) 5.7 5.7 * A IDM Drain Current - Pulsed (Note 1) 38 38 * A VGSS Gate-Source Voltage ± 30 V EAS Single Pulsed Avalanche Energy (Note 2) 700 mJ IAR Avalanche Current (Note 1) 9.5 A EAR Repetitive Avalanche Energy (Note 1) 15.6 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns PD Power Dissipation (TC = 25°C) 156 50 W - Derate above 25°C 1.25 0.4 W/°C TJ, TSTG Operating and Storage Temperature Range -55 to +150 °C TL Maximum lead temperature for soldering, 1/8" from case for 5 seconds 300 °C Symbol Parameter FQP10N60C FQPF10N60C Unit RθJC Thermal Resistance, Junction-to-Case, Max. 0.8 2.5 °C/W RθCS Thermal Resistance, Case-to-Sink, Typ. 0.5 -- °C/W RθJA Thermal Resistance, Junction-to-Ambient, Max. 62.5 62.5 °C/W |
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