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HT45R37 Datasheet(PDF) 6 Page - Holtek Semiconductor Inc |
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HT45R37 Datasheet(HTML) 6 Page - Holtek Semiconductor Inc |
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6 / 100 page  Symbol Parameter Test Conditions Min. Typ. Max. Unit VDD Conditions IOH1 I/O Port Source Current 3V VOH=0.9VDD -2 -4 ¾ mA 5V -5 -8 ¾ mA IOL2 PC0 Sink Current 3V VOL=0.1VDD 0.8 1.5 ¾ mA 5V 2 4 ¾ mA RPH Pull-high Resistance for I/O Ports 3V ¾ 20 60 100 k W 5V 10 30 50 k W VAD A/D Input Voltage ¾¾ 0 ¾ AVDD V VREF A/D Input Reference Voltage Range ¾¾ ¾ AVDD ¾ V DNL A/C Differential Non-Linearity ¾ AVDD=5V, VREF=AVDD, tAD=0.5 ms -2 ¾ 2 LSB INL ADC Integral Non-Linearity ¾ AVDD=5V, VREF=AVDD, tAD=0.5 ms -4 ¾ 4 LSB IADC Additional Power Consumption if A/D Converter is Used 3V ¾ ¾ 0.5 1 mA 5V ¾ 1.5 3 mA Note: 1. 32768Hz is in slow start mode (RTCC.4=1) for the D.C. current measurement. 2. fS is the internal clock for Buzzer, RTC, Time base and WDT. 3. Both Timer/Event Counters are off. Timer filter is disabled for all test conditions. 4. All peripherals are in OFF condition if not mentioned at IDD,ISTB tests. HT45R37 Rev. 1.10 6 January 29, 2010 |
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