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CY8C56LP Datasheet(PDF) 86 Page - Cypress Semiconductor

Part # CY8C56LP
Description  Programmable System-on-Chip (PSoC짰)
PDF  120 Pages
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY8C56LP Datasheet(HTML) 86 Page - Cypress Semiconductor

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PRELIMINARY
PSoC® 5LP: CY8C56LP Family
Datasheet
Document Number: 001-84935 Rev. **
Page 86 of 120
11.5.6 Current Digital-to-analog Converter(IDAC)
All specifications are based on use of the low-resistance IDAC output pins (see Pin Descriptions on page 9 for details). See the IDAC
component data sheet in PSoC Creator for full electrical specifications and APIs.
Unless otherwise specified, all charts and graphs show typical values.
Table 11-30. IDAC DC Specifications
Parameter
Description
Conditions
Min
Typ
Max
Units
Resolution
–
–
8
bits
IOUT
Output current at code = 255
Range = 2.04 mA, code = 255,
VDDA ≥ 2.7 V, Rload = 600 Ω
–2.04
–
mA
Range = 2.04 mA, High mode,
code = 255, VDDA ≤ 2.7 V, Rload =
300
Ω
–2.04
–
mA
Range = 255 µA, code = 255, Rload
= 600
Ω
–255
–
µA
Range = 31.875 µA, code = 255,
Rload = 600
Ω
–
31.875
–
µA
Monotonicity
–
–
Yes
Ezs
Zero scale error
–
0
±1
LSB
Eg
Gain error
Range = 2.04 mA
–
–
±2.5
%
Range = 255 µA
–
–
±2.5
%
Range = 31.875 µA
–
–
±3.5
%
TC_Eg
Temperature coefficient of gain
error
Range = 2.04 mA
–
–
0.045
% / °C
Range = 255 µA
–
–
0.045
% / °C
Range = 31.875 µA
–
–
0.05
% / °C
INL
Integral nonlinearity
Sink mode, range = 255 µA, Codes
8 – 255, Rload = 2.4 k
Ω,
Cload = 15 pF
–±0.9
±1
LSB
Source mode, range = 255 µA,
Codes 8 – 255, Rload = 2.4 k
Ω,
Cload = 15 pF
–±1.2
±1.5
LSB
Source mode, range = 31.875 µA,
Codes 8 - 255, Rload = 20 kΩ,
Cload = 15 pF
–±0.9
±2
LSB
Sink mode, range = 31.875 µA,
Codes 8 - 255, Rload = 20 kΩ,
Cload = 15 pF
–±0.9
±2
LSB
Souce mode, range = 2.04 mA,
Codes 8 - 255, Rload = 600 Ω,
Cload = 15 pF
–±0.9
±2
LSB
Sink mode, range = 2.04 mA,
Codes 8 - 255, Rload = 600 Ω,
Cload = 15 pF
–±0.6
±1
LSB
Note
49. Based on device characterization (Not production tested).



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