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STM8S005C6T6 Datasheet(PDF) 89 Page - STMicroelectronics |
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STM8S005C6T6 Datasheet(HTML) 89 Page - STMicroelectronics |
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89 / 103 page ![]() Figure 42: ADC accuracy characteristics 1. Example of an actual transfer curve. 2. The ideal transfer curve 3. End point correlation line ET = Total unadjusted error: maximum deviation between the actual and the ideal transfer curves. EO = Offset error: deviation between the first actual transition and the first ideal one. EG = Gain error: deviation between the last ideal transition and the last actual one. ED = Differential linearity error: maximum deviation between actual steps and the ideal one. EL = Integral linearity error: maximum deviation between any actual transition and the end point correlation line. Figure 43: Typical application with ADC STM8 10-bit A/D conversion RAIN CAIN VAIN AINx VDD VT 0.6 V VT 0.6 V IL ± 1 µA CADC EMC characteristics 9.3.12 Susceptibility tests are performed on a sample basis during product characterization. 89/103 DocID022186 Rev 3 Electrical characteristics STM8S005K6 STM8S005C6 |
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