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HT45F56 Datasheet(PDF) 9 Page - Holtek Semiconductor Inc

Part # HT45F56
Description  Shock Detector Flash MCU
PDF  90 Pages
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Manufacturer  HOLTEK [Holtek Semiconductor Inc]
Direct Link  http://www.holtek.com
Logo HOLTEK - Holtek Semiconductor Inc

HT45F56 Datasheet(HTML) 9 Page - Holtek Semiconductor Inc

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Rev. 1.11
8
April 11, 2017
Rev. 1.11
9
April 11, 2017
HT45F56
Shock Detector Flash MCU
HT45F56
Shock Detector Flash MCU
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
VDD
Conditions
VIH
Input High Voltage for I/O Ports or
Input Pins except RES pin
5V
─
3.5
─
5.0
V
─
─
0.8VDD
─
VDD
V
Input High Voltage for RES pin
─
─
0.9VDD
─
VDD
V
IOL
Sink Current for I/O Port
3V
VOL = 0.1VDD
8
16
─
mA
5V
16
32
─
mA
IOH
Source Current for I/O Port
3V
VOH = 0.9VDD
-4.0
-8.0
─
mA
5V
-8.0
-16.0
─
mA
RPH
Pull-high Resistance for I/O Ports
3V
─
20
60
100
kΩ
5V
─
10
30
50
kΩ
A.C. Characteristics
Ta=25°C
Symbol
Parameter
Test Condition
Min.
Typ.
Max.
Unit
VDD
Condition
fSYS
System Clock (HIRC)
2.2~5.5V fSYS=fHIRC=8MHz
─
8
─
MHz
System Clock (LIRC)
2.2~5.5V fSYS=fLIRC=32kHz
─
32
─
kHz
fHIRC
High Speed Internal RC Oscillator
(HIRC)
3V/5V
Ta=25°C
-2%
8
+2%
MHz
3V/5V
Ta=0°C ~ 70°C
-5%
8
+5%
MHz
2.2V~5.5V Ta=0°C ~ 70°C
-8%
8
+8%
MHz
2.2V~5.5V Ta= -40°C to 85°C
-12%
8
+12% MHz
fLIRC
Low Speed Internal RC Oscillator
(LIRC)
2.2V~5.5V Ta= -40°C to 85°C
4
32
80
kHz
tTCK
CTCK pin Minimum Input Pulse
Width
─
─
0.3
─
─
μs
tRES
External Reset Minimum Input Pulse
Width
─
─
10
─
─
μs
tSST
System Start-up Timer Period
(Wake-up from Power Down Mode
and fSYS off)
─
fSYS=fH=fHIRC
16
─
─
tHIRC
─
fSYS=fSUB=fLIRC
2
─
─
tLIRC
System Start-up Timer Period
(Wake-up from Power Down Mode
and fSYS on)
─
fSYS=fH=fHIRC
2
─
─
tH
─
fSYS=fSUB=fLIRC
2
─
─
tSUB
tRSTD
System Reset Delay Time
(Power-on Reset, LVR Hardware
Reset, WDTC/RSTC Software Reset)
─
─
25
50
150
ms
System Reset Delay Time
(RES Reset / WDT Hardware Reset)
─
─
8.3
16.7
50
ms
tEERD
EEPROM Read Time
─
─
─
─
4
tSYS
tEEWR
EEPROM Write Time
─
─
─
3
6
ms
Note:1.tSYS=1/fSYS.
2.TomaintaintheaccuracyoftheinternalHIRCoscillatorfrequency,a0.1μFdecouplingcapacitorshould
beconnectedbetweenVDDandVSSandlocatedasclosetothedeviceaspossible.



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