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DLPC3470 Datasheet(PDF) 48 Page - Texas Instruments

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Part # DLPC3470
Description  Display and Light Controller
PDF  70 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

DLPC3470 Datasheet(HTML) 48 Page - Texas Instruments

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DLPC3470
DLPS110 – APRIL 2018
www.ti.com
Product Folder Links: DLPC3470
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
8.3.2.11 Calibration and Debug Support
The DLPC3470 controller contains a test point output port, TSTPT_(7:0), which provides selected system
calibration support, trigger support (TRIG_OUT_2) as well as ASIC debug support. These test points are inputs
while reset is applied and switch to outputs when reset is released. The state of these signals is sampled upon
the release of system reset and the captured value configures the test mode until the next time reset is applied.
Each test point includes an internal pulldown resistor, thus external pullups must be used to modify the default
test configuration. The default configuration (x000) corresponds to the TSTPT_(7:0) outputs remaining tri-stated
to reduce switching activity during normal operation. For maximum flexibility, an option to jumper to an external
pullup is recommended for TSTPT_(2:0). Pullups on TSTPT_(6:3) are used to configure the ASIC for a specific
mode or option. TI does not recommend adding pullups to TSTPT_(7:3) because this has adverse affects for
normal operation. This external pullup is only sampled upon a 0-to-1 transition on the RESETZ input, thus
changing their configuration after reset is released will not have any effect until the next time reset is asserted
and released. Table 10 defines the test mode selection for one programmable scenario defined by TSTPT(2:0).
(1)
These are only the default output selections. Software can reprogram the selection at any time.
Table 10. Test Mode Selection Scenario Defined by TSTPT(2:0)(1)
TSTPT(2:0) CAPTURE VALUE
NO SWITCHING ACTIVITY
CLOCK DEBUG OUTPUT
x000
x010
TSTPT(0)
HI-Z
60 MHz
TSTPT(1)
HI-Z
30 MHz
TSTPT(2)
HI-Z
0.7 to 22.5MHz
TSTPT(3)
HI-Z
HIGH
TSTPT(4)
HI-Z
LOW
TSTPT(5)
HI-Z
HIGH
TSTPT(6)
HI-Z
HIGH
TSTPT(7)
HI-Z
7.5 MHz
8.3.2.12 DMD Interface Considerations
The sub-LVDS HS interface waveform quality and timing on the DLPC3470 controller ASIC is dependent on the
total length of the interconnect system, the spacing between traces, the characteristic impedance, etch losses,
and how well matched the lengths are across the interface. Thus, ensuring positive timing margin requires
attention to many factors.
As an example, DMD interface system timing margin can be calculated as follows:
Setup Margin = (DLPC3470 controller output setup) – (DMD input setup) – (PCB routing mismatch) – (PCB SI
degradation)
(2)
Hold-time Margin = (DLPC3470 controller output hold) – (DMD input hold) – (PCB routing mismatch) – (PCB SI
degradation)
where PCB SI degradation is signal integrity degradation due to PCB affects which includes such things as
Simultaneously Switching Output (SSO) noise, cross-talk and Inter-symbol Interference (ISI) noise.
(3)
DLPC3470 controller I/O timing parameters as well as DMD I/O timing parameters can be found in their
corresponding data sheets. Similarly, PCB routing mismatch can be budgeted and met through controlled PCB
routing. However, PCB SI degradation is a more complicated adjustment.
In an attempt to minimize the signal integrity analysis that would otherwise be required, the following PCB design
guidelines are provided as a reference of an interconnect system that will satisfy both waveform quality and
timing requirements (accounting for both PCB routing mismatch and PCB SI degradation). Variation from these
recommendations may also work, but should be confirmed with PCB signal integrity analysis or lab
measurements.



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