FS32K148HEX0MLFT datasheet(30/101 Pages) NXP

30 / 101 page

3. For reset pads, same Vil levels are applicable

4. The value given is measured at high drive strength mode. For value at low drive strength mode see the Ioh_Standard

value given above.

5. For refernce only. Run simulations with the IBIS model and custom board for accurate results.

6. Typical leakage is given at room temperature. Maximum is given for 125°C. Leakage numbers increase with temperature,

approximately every 12 – 14°C the value doubles. Leakage is tested at hot temperature. We ensure maximums are not

exceeded. Please note that when the ADC module samples a pin, additional currents beyond the leakage number are

drawn to charge the sample and hold capacitances and internal analog busses. These are difficult to predict

7. Several I/O have both high drive and normal drive capability selected by the associated Portx_PCRn[DSE] control bit. All

other GPIOs are normal drive only. For details see IO Signal Description Input Multiplexing sheet(s) attached with the

Reference Manual.

8. When using ENET and SAI on S32K148, the overall device limits associated with high drive pin configurations must be

respected i.e. On 144-pin LQFP the general purpose pins: PTA10, PTD0, and PTE4 must be set to low drive.

9. Measured at input V = VSS

10. Measured at input V = VDD

Table 18. DC electrical specifications at 3.3 V Range for S32K14xW series

Symbol

Parameter

Value

Unit

Notes

Min.

Typ.

Max.

VDD

I/O Supply Voltage

3.13

3.3

Vih

Input Buffer High Voltage

0.7 × VDD

—

VDD + 0.3

Vil

Input Buffer Low Voltage

VSS − 0.3

—

0.3 × VDD

Vhys

Input Buffer Hysteresis

0.06 × VDD

—

IohGPIO

IohGPIO-HD_DSE_0

I/O current source capability measured when

pad Voh = (VDD − 0.8 V)

3.5

—

IolGPIO

IolGPIO-HD_DSE_0

I/O current sink capability measured when

pad Vol = 0.8 V

—

IohGPIO-HD_DSE_1

I/O current source capability measured when

pad Voh = (VDD − 0.8 V)

—

IolGPIO-HD_DSE_1

I/O current sink capability measured when

pad Vol = 0.8 V

—

IOHT

Output high current total for all ports

—

100

IIN

Input leakage current (per pin) for full temperature range at VDD = 3.3 V

All pins other than high drive port pins

0.005

0.5

μA

High drive port pins (excluding XTAL pin)

0.010

0.5

μA

XTAL pin (PTB6) temperature ≤ 125° C

0.010

0.5

μA

XTAL pin (PTB6) temperature ≥ 125° C

1.1

μA

RPU

Internal pullup resistors

kΩ

RPD

Internal pulldown resistors

kΩ

1. For reset pads, same Vih levels are applicable

2. For reset pads, same Vil levels are applicable

3. The value given is measured at high drive strength mode. For value at low drive strength mode see the Ioh_Standard

value given above.

4. Several I/O have both high drive and normal drive capability selected by the associated Portx_PCRn[DSE] control bit. All

other GPIOs are normal drive only. For details see IO Signal Description Input Multiplexing sheet(s) attached with the

Reference Manual.

5. Measured at input V = VSS

6. Measured at input V = VDD

I/O parameters

S32K1xx Data Sheet, Rev. 14, 08/2021

NXP Semiconductors

FS32K148HEX0MLFT Datasheet(PDF) 30 Page - NXP Semiconductors

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